摘要:
An apparatus for non-destructive measurement of internal properties of individual vegetable or fruit pieces comprises: LEDs constructed and arranged to emit radiation into a vegetable or fruit product; pick-up structure constructed and arranged to pick up radiation, emitted by the LEDs, that has entered the vegetable or fruit product and then exited the vegetable or fruit product; a hollow cylinder between the LEDs and the pick-up structure for preventing radiation emitted by the LEDs from directly reaching the pick-up structure; a spectrometer; structure for conveying to the spectrometer the radiation picked up by the pick-up structure; and structure for processing a spectrum frequency and amplitude data as produced by the spectrometer upon the radiation picked up by the pick-up structure being analyzed by the spectrometer.
摘要:
The sensor comprises a chip of a semiconductor material wherein a field-effect transistor is formed the drain and source regions whereof are provided on a first face of the chip, onto which an ion-selective membrane is applied which is coupled to said field-effect transistor.The membrane covers said first face of the chip completely, and terminals are provided in addition which comprise conductive elements applied to the other face of the chip and being connected to said drain and source regions by connections which extend through the chip.These connections are formed by a method providing for the formation in the chip of buried layers of semiconductor material.