Common pixel correction for sensor panels

    公开(公告)号:US09880664B2

    公开(公告)日:2018-01-30

    申请号:US14864351

    申请日:2015-09-24

    Applicant: Apple Inc.

    CPC classification number: G06F3/0418 G06F3/0414 G06F3/044 G06F2203/04106

    Abstract: Noise in sensor panel measurements can be reduced using a common pixel correction algorithm. Noise can be introduced into touch or force sensor panel measurements, for example, by circuitry of a transmit (Tx) section or a receive (Rx) section coupled to one or more sensing nodes of a sensor panel. For example, a digital-to-analog converter in the transmit section or an analog-to-digital converter in the receive section can introduce low-frequency correlated noise. Additionally, transmit and receive sections can introduce uncorrelated noise into the system. Reference nodes, coupled between Tx and Rx sections, can sense correlated and uncorrelated noise from the Tx and Rx sections. The noise measured at reference nodes can be subtract from signals measured at other sensing nodes coupled to the same Rx channel. The measurement at the reference node can be scaled using a scaling parameter to account for differences between reference nodes and sensing nodes.

    Row Column Architecture for Strain Sensing
    3.
    发明申请

    公开(公告)号:US20180292933A1

    公开(公告)日:2018-10-11

    申请号:US15484958

    申请日:2017-04-11

    Applicant: Apple Inc.

    CPC classification number: G01L1/205 G01L1/2262 G06F3/0414 G06F3/0416

    Abstract: Disclosed herein are structures, devices, and methods for sensing physical parameters, such as strain in a surface, using resistance-based parameter sensors and current sensing. An applied strain can cause a differential change in one or more currents from two resistors configured in parallel in the sensor. Strain can be inferred from a ratio of the difference of the two currents to a sum of the two currents. These structures and methods can be adapted to measure strain or other parameters using an array of sensors, with common voltages applied to rows of the array, and currents being summed in column in the array so that fewer receivers are needed.

    Row column architecture for strain sensing

    公开(公告)号:US10444091B2

    公开(公告)日:2019-10-15

    申请号:US15484958

    申请日:2017-04-11

    Applicant: Apple Inc.

    Abstract: Disclosed herein are structures, devices, and methods for sensing physical parameters, such as strain in a surface, using resistance-based parameter sensors and current sensing. An applied strain can cause a differential change in one or more currents from two resistors configured in parallel in the sensor. Strain can be inferred from a ratio of the difference of the two currents to a sum of the two currents. These structures and methods can be adapted to measure strain or other parameters using an array of sensors, with common voltages applied to rows of the array, and currents being summed in column in the array so that fewer receivers are needed.

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