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公开(公告)号:US20240290638A1
公开(公告)日:2024-08-29
申请号:US18174534
申请日:2023-02-24
发明人: Dmitry Lubomirsky , Kaushik Alayavalli , Amit Ashok Hattangadi , Bhawesh Agrawal , Vishwas Basavarajaiah Somashekar , Chethan Somanahalli Malleshappa
IPC分类号: H01L21/67 , H01L21/687
CPC分类号: H01L21/6719 , H01L21/67173 , H01L21/68742
摘要: Exemplary semiconductor processing systems may include a chamber having a body having a sidewall and a base. The chamber may include a pumping liner atop the body and a faceplate atop the pumping liner. The chamber may include a substrate support. The substrate support may include a plate and a shaft. The chamber may include a seal plate coupled with the shaft below the plate. The seal plate may have a greater diameter than the plate. The seal plate may include an RF gasket outward of the plate. The substrate support and the seal plate may be translatable between a transfer position in which the RF gasket is vertically spaced apart from the pumping liner and a process position in which the RF gasket is in contact with the pumping liner. A processing region may be isolated from an environment below the sealing plate when in the process position.