公开(公告)号：US20230139159A1

公开(公告)日：2023-05-04

申请号：US18049930

申请日：2022-10-26

Applicant: Aptiv Technologies Limited

Inventor： Przemyslaw Czachowski ,  Maciej Borowiec

IPC: G01R31/00 ,  G01R31/28

Abstract: Disclosed is a testing device for an automotive controller, which includes a plurality of Device Under Test (DUT) lines for connection to respective DUT lines in the automotive controller, and first and second multiplexers for selecting individual DUT lines. First and second measurement modules are connected to the multiplexers for measuring signal characteristics on the selected DUT lines. An interconnect circuit is operable for selectively connecting stimulation modules to the measurement modules for stimulating electrical signals on the selected DUT lines. A controller is provided to control the switching of the multiplexers and the interconnect circuit and for receiving the measured signal characteristics from the first and second measurement modules for testing the respective DUT lines in the automotive controller. Also disclosed are methods and software for controlling testing devices.

公开(公告)号：US11374846B1

公开(公告)日：2022-06-28

申请号：US17650838

申请日：2022-02-11

Applicant: Aptiv Technologies Limited

Inventor： Maciej Borowiec ,  Przemyslaw Czachowski

IPC: H04L43/50 ,  H04L12/40

Abstract: Testing device for testing a LIN master device having a plurality of LIN channels. The device has a plurality of LIN channel terminals, each for connection to a LIN bus associated with one of the LIN channels of the LIN master device. One or more UART circuits are communicatively coupled to the plurality of LIN channel terminals for receiving and transmitting signals on the respective LIN bus. A controller is communicatively coupled to the one or more UART circuits and is configured to implement a LIN slave state machine on each of the LIN busses using the one or more UART circuits for emulating LIN slave behaviour.