公开(公告)号：US11733187B2

公开(公告)日：2023-08-22

申请号：US17175115

申请日：2021-02-12

Applicant: Arcam AB

Inventor： David Svensson ,  Phillip Simon Mahoney

IPC: G01N23/225 ,  H01J37/305 ,  H01J37/244 ,  B22F10/28 ,  B22F12/90 ,  B22F10/36 ,  B22F10/85 ,  B22F10/31 ,  B33Y30/00 ,  B33Y50/02 ,  B33Y10/00 ,  B23K15/00 ,  G01N23/2252

CPC classification number: G01N23/2252 ,  B22F10/28 ,  B22F10/31 ,  B22F10/36 ,  B22F10/85 ,  B22F12/90 ,  B23K15/002 ,  B23K15/0013 ,  B23K15/0086 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  H01J37/244 ,  H01J37/305 ,  G01N2223/079 ,  G01N2223/303 ,  G01N2223/507 ,  H01J2237/2448 ,  H01J2237/30433 ,  H01J2237/3128

Abstract: An electron beam additive manufacturing system includes an electron beam source, an x-ray detection sensor configured to generate a waveform corresponding to an amount of x-rays detected by the x-ray detection sensor, and an electronic control unit comprising a processor and a non-transitory computer-readable memory, the electronic control unit communicatively coupled to the electron beam source and the x-ray detection sensor. The electronic control unit is configured to cause the electron beam source to emit an electron beam such that the electron beam impinges a verification plate, receive the waveform generated by the x-ray detection sensor in response to the x-ray detection sensor capturing x-rays emitted from the impingement of the electron beam with the verification plate, and determine a melt performance of a surface material of the verification plate based on the waveform.

公开(公告)号：US11493650B2

公开(公告)日：2022-11-08

申请号：US16871480

申请日：2020-05-11

Applicant: Arcam AB

Inventor： David Svensson

IPC: G01T1/29 ,  B33Y50/02 ,  B22F10/28 ,  B22F12/90 ,  B23K15/00

Abstract: A method for detecting a position of an energy beam comprises mapping a first density modulated x-ray signal with a plurality of locations on an energy beam target, thereby generating a model of a background x-ray intensity. The method further comprises forming an x-ray signal time series using subsequent intensity modulated x-ray signals, each resulting from scanning the energy beam along the energy beam target in one of a plurality of directions at one of a plurality of speeds, and determining the position of the energy beam based upon a received x-ray signal strength based on the x-ray signal time series and the model of the background x-ray intensity.

公开(公告)号：US20220260509A1

公开(公告)日：2022-08-18

申请号：US17175115

申请日：2021-02-12

Applicant: Arcam AB

Inventor： David Svensson ,  Phillip Simon Mahoney

IPC: G01N23/2252 ,  H01J37/244 ,  H01J37/305 ,  B22F10/28 ,  B22F12/90 ,  B22F10/36 ,  B33Y30/00 ,  B33Y50/02 ,  B33Y10/00 ,  B23K15/00

Abstract: An electron beam additive manufacturing system includes an electron beam source, an x-ray detection sensor configured to generate a waveform corresponding to an amount of x-rays detected by the x-ray detection sensor, and an electronic control unit comprising a processor and a non-transitory computer-readable memory, the electronic control unit communicatively coupled to the electron beam source and the x-ray detection sensor. The electronic control unit is configured to cause the electron beam source to emit an electron beam such that the electron beam impinges a verification plate, receive the waveform generated by the x-ray detection sensor in response to the x-ray detection sensor capturing x-rays emitted from the impingement of the electron beam with the verification plate, and determine a melt performance of a surface material of the verification plate based on the waveform.

公开(公告)号：US20220072649A1

公开(公告)日：2022-03-10

申请号：US17014627

申请日：2020-09-08

Applicant: ARCAM AB

Inventor： David Svensson

IPC: B23K15/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K15/02

Abstract: Additive manufacturing systems, and methods of encoding and decoding data within a build chamber of an additive manufacturing system are disclosed. An additive manufacturing system includes a build chamber having a patterned surface, the patterned surface having indicia therein or thereon. The additive manufacturing system further includes an energy beam (EB) gun configured to emit an energy beam and a sensor configured to detect one or more x-ray emissions that are generated as a result of impingement of the energy beam on the patterned surface. The one or more x-ray emissions include characteristics that correspond to the indicia such that data encoded in the indicia can be obtained from the characteristics of the one or more x-ray emissions.

公开(公告)号：US20210349224A1

公开(公告)日：2021-11-11

申请号：US16871480

申请日：2020-05-11

Applicant: Arcam AB

Inventor： David Svensson

IPC: G01T1/29 ,  B33Y50/02

Abstract: A method for detecting a position of an energy beam comprises mapping a first density modulated x-ray signal with a plurality of locations on an energy beam target, thereby generating a model of a background x-ray intensity. The method further comprises forming an x-ray signal time series using subsequent intensity modulated x-ray signals, each resulting from scanning the energy beam along the energy beam target in one of a plurality of directions at one of a plurality of speeds, and determining the position of the energy beam based upon a received x-ray signal strength based on the x-ray signal time series and the model of the background x-ray intensity.