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公开(公告)号:US12092519B2
公开(公告)日:2024-09-17
申请号:US18557871
申请日:2022-04-27
Inventor: Mohammed Tharwat Hassan Mohammed , Dandan Hui , Husain Alqattan
CPC classification number: G01J11/00 , H01S3/0014
Abstract: System and method configured for real-time, direct, all-optical methodology of measurement of a temporal profile of optical field. In one case, such measurement is carried out by recording electronic delay response of a target material system triggered by a strong driving optical field (in particular—by pulsed light with sub-femtosecond pulses containing a few cycles of optical field each). A corresponding all-optical metrological tool configured to operate with (sub-)femtosecond resolution. Demonstration of the on-demand sub-femtosecond electron motion control in solid-state with the use of synthesized waveforms of optical field.
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公开(公告)号:US12174116B2
公开(公告)日:2024-12-24
申请号:US18557478
申请日:2022-04-27
Inventor: Mohammed Tharwat Hassan Mohammed , Dandan Hui , Husain Alqattan
Abstract: Methodology for optical switching and/or coding of information with attosecond time resolution and, in particular, binary encoding of data based on modulation of reflectivity or transmissivity of a target non-electrically-conducting material system in a strong light field.
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