公开(公告)号：US09830245B2

公开(公告)日：2017-11-28

申请号：US13929605

申请日：2013-06-27

Applicant: Atmel Corporation

Inventor： Ingar Hanssen

IPC: G06F11/00 ,  G06F11/34 ,  G06F11/30

CPC classification number: G06F11/348 ,  G06F11/3037 ,  G06F11/3476 ,  G06F2201/835

Abstract: Systems and methods for generating event trace records are described. One example system includes an event subsystem that receives signaling events generated by one or more associated peripheral devices. The system includes a trace module which is coupled to the event subsystem. The trace module receives the signaling events, samples the received signaling events, receives timestamps, and generates event trace records. Each event trace record includes the sampled signaling events and a respective timestamp indicative of the sampling time. The trace module can generate save commands, and deliver the event trace records and the save commands as outputs.

公开(公告)号：US20170336893A1

公开(公告)日：2017-11-23

申请号：US15612289

申请日：2017-06-02

Applicant: Atmel Corporation

Inventor： Ingar Hanssen ,  Rian Whelan

IPC: G06F3/044 ,  G01R27/26 ,  H03K17/96 ,  G06F3/041 ,  G06F3/038

CPC classification number: G06F3/044 ,  G01R27/2605 ,  G06F3/038 ,  G06F3/0416 ,  G06F3/045 ,  H03K17/9622 ,  H03K2217/960725 ,  H03K2217/960745

Abstract: In one embodiment, a device includes one or more processors and one or more memory units. The one or more memory units collectively store logic configured to cause the one or more processors to perform operations including obtaining a first measurement associated with a first voltage, the first voltage output by the mutual-capacitance measurement circuit in response to a first change in capacitance, and obtaining a second measurement associated with a second voltage, the second voltage output by the mutual-capacitance measurement circuit in response to a second change in capacitance. The operations further include calculating a differential measurement using a difference between the first measurement and the second measurement and determining whether a touch or proximity event has occurred based at least in part on the calculated differential measurement.

公开(公告)号：US20150028887A1

公开(公告)日：2015-01-29

申请号：US13953530

申请日：2013-07-29

Applicant: Atmel Corporation

Inventor： Ingar Hanssen

IPC: G01R21/00 ,  G01R27/26

CPC classification number: G01R21/006 ,  G01R27/2688 ,  G01R31/3004 ,  G01R31/31721

Abstract: By powering an electronic component operating in an ultra-low power mode from a pre-charged measuring capacitor and measuring the time to discharge the capacitor to a trip voltage level, measurement data can be obtained. In some implementations, the capacitance of the capacitor can be obtained by adding a known current to the unknown current drawn from the capacitor and calculating the capacitance using a mathematical formula.

Abstract translation: 通过从预充电测量电容器对以超低功率模式工作的电子元件供电并测量将电容器放电到跳闸电压电平的时间，可以获得测量数据。 在一些实施方式中，可以通过将已知电流加到从电容器中得到的未知电流并使用数学公式计算电容来获得电容器的电容。

公开(公告)号：US10082922B2

公开(公告)日：2018-09-25

申请号：US15612289

申请日：2017-06-02

Applicant: Atmel Corporation

Inventor： Ingar Hanssen ,  Rian Whelan

IPC: G06F3/045 ,  G06F3/044 ,  H03K17/96 ,  G01R27/26 ,  G06F3/041 ,  G06F3/038

CPC classification number: G06F3/044 ,  G01R27/2605 ,  G06F3/038 ,  G06F3/0416 ,  G06F3/045 ,  H03K17/9622 ,  H03K2217/960725 ,  H03K2217/960745

Abstract: In one embodiment, a device includes one or more processors and one or more memory units. The one or more memory units collectively store logic configured to cause the one or more processors to perform operations including obtaining a first measurement associated with a first voltage, the first voltage output by the mutual-capacitance measurement circuit in response to a first change in capacitance, and obtaining a second measurement associated with a second voltage, the second voltage output by the mutual-capacitance measurement circuit in response to a second change in capacitance. The operations further include calculating a differential measurement using a difference between the first measurement and the second measurement and determining whether a touch or proximity event has occurred based at least in part on the calculated differential measurement.

公开(公告)号：US20150378423A1

公开(公告)日：2015-12-31

申请号：US14316625

申请日：2014-06-26

Applicant: Atmel Corporation

Inventor： Ingar Hanssen

IPC: G06F1/32

CPC classification number: G06F1/3296 ,  G06F1/3243 ,  G06F1/3287 ,  G06F17/505 ,  Y02D10/152 ,  Y02D10/171 ,  Y02D10/172 ,  Y02P90/02

Abstract: A power trace port included in a system (e.g., a microcontroller system) having multiple power domains includes a power trace port that outputs digital signals indicating the states of the power domains. If each power domain is independent of other power domains in the system, each power domain can have its own set of power trace pins in the power trace port that are at least partially external to the system. If a power domain has multiple states, multiple pins can be used to indicate the multiple states. In some implementations, the power trace port can include performance level pins for providing performance level signals. The power trace port can be coupled to power trace probes of a power analyzer that is external to the system for generating power traces.

Abstract translation: 包括在具有多个电力域的系统（例如，微控制器系统）中的电力跟踪端口包括输出指示电力域的状态的数字信号的电力跟踪端口。 如果每个电源域独立于系统中的其他电源域，则每个电源域可以在电源跟踪端口中具有至少部分在系统外部的自己的一组电源跟踪引脚。 如果电源域有多个状态，则可以使用多个引脚来指示多个状态。 在一些实现中，电力跟踪端口可以包括用于提供性能等级信号的性能级别引脚。 电源跟踪端口可以耦合到系统外部的功率分析仪的电源跟踪探头，用于产生电源轨迹。

公开(公告)号：US20150067661A1

公开(公告)日：2015-03-05

申请号：US14017047

申请日：2013-09-03

Applicant: Atmel Corporation

Inventor： Ingar Hanssen

IPC: G06F9/45

CPC classification number: G06F8/443 ,  G06F11/3419 ,  G06F11/3466 ,  G06F2201/88

Abstract: An on-chip function call aware software code profiling counter system and method is disclosed. When building software code a compiler/tool-chain can modify prologues and epilogues of functions to add instrumentation code which uniquely identifies the function. Each function included in the instrumented source code tree is assigned a unique identifier (ID) by the compiler/tool-chain. Writing a unique ID for a function to a register starts profiling for the function. The profiling is performed by a counter that counts the number of instruction cycles since the last unique ID was written to the register. When a unique ID for a next function to be profiled is written to the register, the old register value and the counter value are latched to one or more buffers and the counter is cleared to start the next count sequence for the next function to be profiled.

Abstract translation: 公开了一种片上功能呼叫识别软件代码分析计数器系统和方法。 构建软件代码时，编译器/工具链可以修改函数的序言和结尾，以添加唯一标识功能的检测代码。 包含在仪器化源代码树中的每个功能都由编译器/工具链分配唯一的标识符（ID）。 将函数的唯一ID写入寄存器开始对该函数进行分析。 仿真由计数器执行，该计数器自上次唯一ID被写入寄存器以来，对指令周期数进行计数。 当将要分析的下一个功能的唯一ID写入寄存器时，旧的寄存器值和计数器值被锁存到一个或多个缓冲区，并且计数器被清除以启动下一个要被分析的函数的下一个计数序列 。

公开(公告)号：US20150028898A1

公开(公告)日：2015-01-29

申请号：US13953140

申请日：2013-07-29

Applicant: Atmel Corporation

Inventor： Ingar Hanssen ,  Jo Inge Lamo

IPC: G01R21/06

CPC classification number: G01R21/06

Abstract: A sense resistor is coupled between a power source and one or more power pins of an integrated circuit (IC) chip including a circuit component (e.g., a microcontroller unit (MCU)). An on-chip amplifier (e.g., a programmable gain amplifier or op-amp) amplifies the voltage drop over the sense resistor to a level that is within the dynamic range of an on-chip analog-to-digital converter (ADC). In some implementations, the measured signals can be time-stamped and stored in a trace buffer and aligned with other trace data using a front-end tool (e.g., a personal computer). In some implementations, circuitry is included for detecting and handling power consumption events associated with the circuit component. In some implementations, a program counter associated with the circuit component is synchronously sampled with the power consumption measurements and/or other data sources.

Abstract translation: 感测电阻器耦合在电源和包括电路组件（例如，微控制器单元（MCU））的集成电路（IC）芯片的一个或多个电源引脚之间。 片内放大器（例如，可编程增益放大器或运算放大器）将检测电阻器上的压降放大到片上模数转换器（ADC）动态范围内的电平。 在一些实现中，测量的信号可以被时间戳并存储在跟踪缓冲器中并且使用前端工具（例如，个人计算机）与其他跟踪数据对齐。 在一些实现中，包括用于检测和处理与电路部件相关联的功耗事件的电路。 在一些实现中，与电路部件相关联的程序计数器与功耗测量和/或其他数据源同步采样。

公开(公告)号：US20150006970A1

公开(公告)日：2015-01-01

申请号：US13929617

申请日：2013-06-27

Applicant: Atmel Corporation

Inventor： Ingar Hanssen

IPC: G06F11/34

CPC classification number: G06F11/0706 ,  G06F11/2221 ,  G06F11/3037 ,  G06F11/3055 ,  G06F11/3476 ,  G06F11/3485 ,  G06F2201/835

Abstract: Systems and methods for generating DMA transaction trace records are described. One example system includes a controller that includes a trace module. The trace module receives transfer requests for direct memory access channels, receives timestamps indicative of a transfer request time, generates trace records, wherein each trace record includes a respective timestamp indicative of a transfer request time, generates save commands, and delivers the trace records and the save commands as outputs. The system includes a storage module for saving trace records.

Abstract translation: 描述用于生成DMA事务跟踪记录的系统和方法。 一个示例性系统包括包括跟踪模块的控制器。 跟踪模块接收直接存储器访问通道的传送请求，接收指示传输请求时间的时间戳，生成跟踪记录，其中每个跟踪记录包括指示传送请求时间的相应时间戳，生成保存命令，并传送跟踪记录和 保存命令作为输出。 该系统包括一个用于保存跟踪记录的存储模块。

公开(公告)号：US09696353B2

公开(公告)日：2017-07-04

申请号：US13953140

申请日：2013-07-29

Applicant: Atmel Corporation

Inventor： Ingar Hanssen ,  Jo Inge Lamo

IPC: G01R21/06

CPC classification number: G01R21/06

Abstract: A sense resistor is coupled between a power source and one or more power pins of an integrated circuit (IC) chip including a circuit component (e.g., a microcontroller unit (MCU)). An on-chip amplifier (e.g., a programmable gain amplifier or op-amp) amplifies the voltage drop over the sense resistor to a level that is within the dynamic range of an on-chip analog-to-digital converter (ADC). In some implementations, the measured signals can be time-stamped and stored in a trace buffer and aligned with other trace data using a front-end tool (e.g., a personal computer). In some implementations, circuitry is included for detecting and handling power consumption events associated with the circuit component. In some implementations, a program counter associated with the circuit component is synchronously sampled with the power consumption measurements and/or other data sources.

公开(公告)号：US09671916B2

公开(公告)日：2017-06-06

申请号：US15094744

申请日：2016-04-08

Applicant: Atmel Corporation

Inventor： Ingar Hanssen ,  Rian Whelan

IPC: G06F3/044 ,  H03K17/96 ,  G01R27/26 ,  G06F3/041 ,  G06F3/038

CPC classification number: G06F3/044 ,  G01R27/2605 ,  G06F3/038 ,  G06F3/0416 ,  G06F3/045 ,  H03K17/9622 ,  H03K2217/960725 ,  H03K2217/960745

Abstract: In one embodiment, a device comprises one or more memory units collectively storing logic configured to cause one or more processors to perform operations. The operations comprise: obtaining a first measurement associated with a first voltage output by a mutual-capacitance measurement circuit; obtaining a second measurement associated with a second voltage, the second voltage output by the mutual-capacitance measurement circuit in response to a first change in capacitance; obtaining a third measurement associated with a third voltage output by the mutual capacitance measurement circuit, the third voltage being different from the first voltage; and obtaining a fourth measurement associated with a fourth voltage, the fourth voltage output by the mutual-capacitance measurement circuit in response to a second change in capacitance. The operations further comprise calculating a differential measurement using a difference between the first measurement and the second measurement and a difference between the third measurement and the fourth measurement.