Core for controlling multiple serial peripheral interfaces (SPI's)

    公开(公告)号:US10467007B1

    公开(公告)日:2019-11-05

    申请号:US15995303

    申请日:2018-06-01

    Abstract: A core suitable for inclusion in an ASIC or other integrated circuit includes a plurality of SPI masters, each of which is able to control and coordinate the timing of a plurality of SPI-controlled devices via an associated SPI bus. Each SPI master is controlled by a corresponding core controller that includes memory, interrupts, flags, timers, and an instruction processor that can independently execute instructions stored in the memory to control data communication between the core controller and its associated SPI master, and between the SPI master and one or more SPI slave devices. The core controllers can be simultaneously started, resynchronized, staggered, and otherwise coordinated with each other. Embodiments further permit bypassing of the core controllers for direct data exchange between external resources and the SPI masters.

    INTEGRATED CIRCUIT WITH INTENTIONAL RADIATION INTOLERANCE

    公开(公告)号:US20220392854A1

    公开(公告)日:2022-12-08

    申请号:US17742925

    申请日:2022-05-12

    Abstract: An integrated circuit (IC) implements a radiation tolerance limiting feature (RTLF) to ensure that the IC, as manufactured, will fail one or more applicable radiation tolerance tests, for example by reducing or eliminating a required voltage or blocking a required signal. As a result, the IC can be manufactured by any suitable IC foundry, and exported without restriction. The RTLF can include a leakage component, such as an oxide dielectric capacitor, a radiation-sensitive MOSFET or SCR, or a photocurrent generating component. The RTLF can include redundancy to ensure reliability. A plurality of RTLFs can be included to ensure failure of any desired combination of applicable radiation tolerance tests, such as total radiation dosage, linear energy transfer events, radiation dose rate, and single event upset. The RTLF can be obfuscated within the IC design. The RTLF can include a testing output to ensure its functionality.

Patent Agency Ranking