公开(公告)号：US20160332192A1

公开(公告)日：2016-11-17

申请号：US15096376

申请日：2016-04-12

Applicant: BOE TECHNOLOGY GROUP CO., LTD. ,  HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Yangkun JING ,  Lei HU ,  Ting GUO

IPC: B05D3/06 ,  G02F1/1337 ,  B05D1/02

CPC classification number: G02F1/133788 ,  G02F1/1303

Abstract: The present invention provides a photo alignment device, a photo alignment method and an alignment film preparation system. The photo alignment device comprises a photo alignment unit, a temperature acquisition unit and a control unit, the photo alignment unit used to perform preheating, curing and photo alignment on a film-to-be-aligned layer; the temperature acquisition unit used to perform real-time acquisition on temperatures of the film-to-be-aligned layer during the preheating, curing, and photo alignment in synchronization with the photo alignment unit, and feed the acquired temperatures back to the control unit; and the control unit used to determine whether the fed back temperatures are within preset ranges of temperature, and adjust position, power and/or speed of the photo alignment unit based on the determination result, to cause the temperatures of the film-to-be-aligned layer during the preheating, curing, and photo alignment to be within their respective preset ranges of temperature.

Abstract translation: 本发明提供一种光取向装置，光取向方法和取向膜制备系统。 光对准装置包括光对准单元，温度获取单元和控制单元，所述光对准单元用于在要被对准的层上进行预热，固化和光取向; 温度获取单元用于在与光对准单元同步的预热，固化和光对准期间对待对准层的温度执行实时采集，并将获取的温度返回到控制单元 ; 以及用于确定反馈温度是否在预设的温度范围内的控制单元，并且基于确定结果来调整光对准单元的位置，功率和/或速度，以使得成膜的温度 在预热，固化和光对准期间的对准层在其各自的预设温度范围内。

公开(公告)号：US20180247596A1

公开(公告)日：2018-08-30

申请号：US15552409

申请日：2017-03-29

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Hui ZHAO ,  Libin LIU ,  Lei HU ,  Wenjing TAN

IPC: G09G3/3291 ,  G09G3/3233 ,  H05K1/18

CPC classification number: G09G3/3291 ,  G09G3/3208 ,  G09G3/3233 ,  G09G2310/0289 ,  G09G2320/0204 ,  G09G2330/026 ,  H05K1/18 ,  H05K2201/1003

Abstract: A circuit structure includes: a control circuit, including a first end, a second end and a control end; a switching circuit, including a first interface, a second interface and a control interface; a driving power line, connected with the control end of the control circuit and configured to provide a driving power voltage in a working stage to conduct the first end of the control circuit and the second end of the control circuit; and a first voltage line, connected with the first end of the control circuit and configured to, when the first end of the control circuit and the second end of the control circuit are conducted, provide a first voltage to the control interface of the switching circuit through the control circuit to disconnect the first interface of the switching circuit from the second interface of the switching circuit.

公开(公告)号：US20170052214A1

公开(公告)日：2017-02-23

申请号：US15159181

申请日：2016-05-19

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Lei HU ,  Hui ZHAO ,  Wenjing TAN

IPC: G01R1/04

CPC classification number: G01R31/2808

Abstract: The present invention discloses a position calibration method, a test circuit board, a sample panel and a position calibration apparatus. The position calibration method comprises: Step S1, providing a test circuit board and forming at least one first sample connecting finger; Step S2, making a sample panel comprising second sample connecting fingers corresponding to each first sample connecting finger; Step S3, bringing the test circuit board into contact with the sample panel; and Step S4, detecting whether each first sample connecting finger is electrically connected to a corresponding second sample connecting finger, and when any one of the first sample connecting fingers is detected as in disconnection with the corresponding second sample connecting finger, adjusting a position of the test circuit board and/or the sample panel.

Abstract translation: 本发明公开了一种位置校准方法，测试电路板，样品面板和位置校准装置。 位置校准方法包括：步骤S1，提供测试电路板并形成连接手指的至少一个第一样本; 步骤S2，使样本面板包括对应于每个第一样本连接手指的第二样本连接手指; 步骤S3，使测试电路板与样品面板接触; 和步骤S4，检测每个第一样本连接手指是否电连接到对应的第二样本连接手指，并且当与相应的第二样本连接手指断开时检测到第一样本连接指中的任何一个时，调整 测试电路板和/或样品面板。