公开(公告)号：US20230419466A1

公开(公告)日：2023-12-28

申请号：US18038197

申请日：2020-11-26

Applicant: BOE Technology Group Co., Ltd.

Inventor： Quanguo ZHOU ,  Kaiqin XU ,  Jiahong ZOU ,  Guolin ZHANG ,  Xun HUANG ,  Qing ZHANG ,  Lijia ZHOU ,  Zhidong WANG ,  Hongxiang SHEN ,  Hao TANG ,  Jiuyang CHENG

IPC: G06T7/00 ,  G06T3/40

CPC classification number: G06T7/0002 ,  G06T3/40 ,  G06T2207/20084 ,  G06T2207/30168

Abstract: Provided are a method and apparatus for identifying the defect grade of a bad picture, and a storage medium. The method includes: determining the defect size of a defect from a bad picture; according to a product model corresponding to the bad picture, determining the design size of a pattern corresponding to a component that is adjacent to the position of the defect; determining the defect grade of the defect according to the defect type of the defect and a magnitude relationship between the defect size and the design size, wherein the defect grade is the degree to which the defect affects product yield.

公开(公告)号：US20220269901A1

公开(公告)日：2022-08-25

申请号：US17507918

申请日：2021-10-22

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Guolin ZHANG ,  Kaiqin XU ,  Jiahong ZOU ,  Quanguo ZHOU ,  Xun HUANG ,  Hongxiang SHEN ,  Jiuyang CHENG

IPC: G06K9/62 ,  G06K9/46

Abstract: An image processing method includes: receiving a processing instruction for an image; screening out a plurality of target images from a plurality of acquired images; determining a first feature value and a second feature value of the target area of each of the target images; determining a similarity between the first feature values of the target areas in every two target images according to all the determined first feature values, and determining a similarity between the second feature values of the target areas in every two target images according to all the determined second feature values; and, if a first target similarity is within a first preset range, and a second target similarity is within a second preset range, determining that a first image and a second image belong to the same image set.

公开(公告)号：US20220245782A1

公开(公告)日：2022-08-04

申请号：US17476321

申请日：2021-09-15

Applicant: BOE Technology Group Co., Ltd.

Inventor： Quanguo ZHOU ,  Kaiqin XU ,  Jiahong ZOU ,  Guolin ZHANG ,  Xun HUANG ,  Qing ZHANG ,  Zhidong WANG ,  Lijia ZHOU ,  Hongxiang SHEN ,  Jiuyang CHENG ,  Hao TANG

IPC: G06T7/00 ,  G06T5/50 ,  G06N3/08 ,  G06T7/55 ,  G06K9/46 ,  G06K9/62

Abstract: A method for classifying an image of a displaying base plate includes: acquiring an image to be checked; from a first predetermined-type set, determining a type of the image to be checked. The first predetermined-type set includes: a first image type, a second image type and a third image type. An image of the first image type is a no-defect image, an image of the second image type is a blurred image, and an image of the third image type is a defect image. When the type of the image to be checked is the third image type, by using a first convolutional neural network, determining a defect data of the image to be checked, wherein the defect image refers to an image of a displaying base plate having a defect, and the defect data contains a defect type of the displaying base plate in the image to be checked.