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1.发明申请公开(公告)号：US20190252641A1
公开(公告)日：2019-08-15
申请号：US16345272
申请日：2018-07-27
Inventor： Guolin ZHANG , Jiuyang CHENG , Jiahong ZOU , Wenhao XIAO , Liangfeng MOU , Junliang LI
IPC: H01L51/52
CPC classification number: H01L51/5256 , H01L51/524
Abstract: The present disclosure discloses an OLED encapsulation structure, a display device and a method for manufacturing an OLED encapsulation structure. The OLED encapsulation structure includes an OLED device and a plurality of film layers covering the OLED device. The plurality of film layers includes an inorganic layer and an organic layer stacked alternately, and contacting surfaces of any two film layers in contact with each other among the plurality of film layers include complementary topographies such that the any two film layers in contact with each other are stuck with each other.
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Patent Agency Ranking
公开(公告)号：US20240169511A1
公开(公告)日：2024-05-23
申请号：US17771764
申请日：2021-05-25
Inventor： Guolin ZHANG
Abstract: Provided are a method and apparatus for acquiring images, and a storage medium thereof. The method includes: acquiring a first image embodying a display panel; determining repair indication information of a plurality of defects in the display panel in the first image, wherein the repair indication information indicates a degree of a repair demand for the defects; selecting a target defect from the plurality of defects based on the repair indication information of the plurality of defects; and acquiring a repair reference image embodying the target defect by photographing the target defect in the display panel. A repair reference image embodying all defects in the display panel does not need to be acquired, thereby ensuring high detection efficiency of the AOI system for the display panel. In addition, a probability that the target defect selected based on the repair indication information needs to be repaired is high, which effectively improves accuracy of AOI system in acquiring the repair reference image and achieves a high yield of the display panels.
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公开(公告)号：US20230419466A1
公开(公告)日：2023-12-28
申请号：US18038197
申请日：2020-11-26
Applicant: BOE Technology Group Co., Ltd.
Inventor： Quanguo ZHOU , Kaiqin XU , Jiahong ZOU , Guolin ZHANG , Xun HUANG , Qing ZHANG , Lijia ZHOU , Zhidong WANG , Hongxiang SHEN , Hao TANG , Jiuyang CHENG
CPC classification number: G06T7/0002 , G06T3/40 , G06T2207/20084 , G06T2207/30168
Abstract: Provided are a method and apparatus for identifying the defect grade of a bad picture, and a storage medium. The method includes: determining the defect size of a defect from a bad picture; according to a product model corresponding to the bad picture, determining the design size of a pattern corresponding to a component that is adjacent to the position of the defect; determining the defect grade of the defect according to the defect type of the defect and a magnitude relationship between the defect size and the design size, wherein the defect grade is the degree to which the defect affects product yield.
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公开(公告)号：US20220269901A1
公开(公告)日：2022-08-25
申请号：US17507918
申请日：2021-10-22
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Guolin ZHANG , Kaiqin XU , Jiahong ZOU , Quanguo ZHOU , Xun HUANG , Hongxiang SHEN , Jiuyang CHENG
Abstract: An image processing method includes: receiving a processing instruction for an image; screening out a plurality of target images from a plurality of acquired images; determining a first feature value and a second feature value of the target area of each of the target images; determining a similarity between the first feature values of the target areas in every two target images according to all the determined first feature values, and determining a similarity between the second feature values of the target areas in every two target images according to all the determined second feature values; and, if a first target similarity is within a first preset range, and a second target similarity is within a second preset range, determining that a first image and a second image belong to the same image set.
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公开(公告)号：US20220245782A1
公开(公告)日：2022-08-04
申请号：US17476321
申请日：2021-09-15
Applicant: BOE Technology Group Co., Ltd.
Inventor： Quanguo ZHOU , Kaiqin XU , Jiahong ZOU , Guolin ZHANG , Xun HUANG , Qing ZHANG , Zhidong WANG , Lijia ZHOU , Hongxiang SHEN , Jiuyang CHENG , Hao TANG
Abstract: A method for classifying an image of a displaying base plate includes: acquiring an image to be checked; from a first predetermined-type set, determining a type of the image to be checked. The first predetermined-type set includes: a first image type, a second image type and a third image type. An image of the first image type is a no-defect image, an image of the second image type is a blurred image, and an image of the third image type is a defect image. When the type of the image to be checked is the third image type, by using a first convolutional neural network, determining a defect data of the image to be checked, wherein the defect image refers to an image of a displaying base plate having a defect, and the defect data contains a defect type of the displaying base plate in the image to be checked.
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公开(公告)号：US20200379307A1
公开(公告)日：2020-12-03
申请号：US16082709
申请日：2018-01-25
Inventor： Guolin ZHANG , Jiuyang CHENG , Jiahong ZOU , Wenhao XIAO , Junliang LI , Yihong MA
IPC: G02F1/1362 , G02F1/1368 , G02F1/1333 , H01L27/12
Abstract: The present disclosure provides an array substrate, a manufacturing method of an array substrate, and a display device. The array substrate includes: a base substrate; a first signal line, extending in a first direction and located on the base substrate; a second signal line, extending in a second direction and located on a side of the first signal line away from the base substrate and insulated with the first signal line, the first direction and the second direction crossing with each other. A side of the first signal line facing the second signal line is provided with a groove, the groove is located at a crossing region between the first signal line and the second signal line, in the crossing region, an otherographic projection of the second signal line on the base substrate completely falls into an orthographic projection of the groove on the base substrate.
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