公开(公告)号：US20240327155A1

公开(公告)日：2024-10-03

申请号：US18618284

申请日：2024-03-27

Applicant: BROTHER KOGYO KABUSHIKI KAISHA

Inventor： Yuki TSUJIMURA ,  Takashi SUZUKI ,  Tetsuya SASO

IPC: B65H5/06

CPC classification number: B65H5/062 ,  B65H2301/51532 ,  B65H2551/26 ,  B65H2801/03

Abstract: An image forming apparatus includes: a conveyor conveying a sheet medium; an image forming part forming an image on the sheet medium; a cutting part; a signal outputting part outputting a state signal; a reporting part; and a controller. The controller executes: an image forming process of conveying the sheet medium by the conveyor and forming the image on the sheet medium by the image forming part, and a cutting process of moving the cutting part. In a case where the sheet medium has not been cut even though the cutting process was executed during image formation on the sheet medium in the image forming process, the controller continues the image formation without interruption and causes the reporting part to report information regarding a failure of cutting of the sheet medium.

公开(公告)号：US20180207968A1

公开(公告)日：2018-07-26

申请号：US15874999

申请日：2018-01-19

Applicant: BROTHER KOGYO KABUSHIKI KAISHA

Inventor： Yusuke ARAI ,  Kenta HORADE ,  Tsuyoshi ITO ,  Kohei TERADA ,  Tetsuya SASO

IPC: B41J29/393 ,  B41J11/00 ,  B41J2/04 ,  H04N1/00

CPC classification number: B41J29/393 ,  B41J2/04 ,  B41J2/2135 ,  B41J11/008 ,  B41J11/46 ,  B41J13/0027 ,  B41J29/38 ,  H04N1/00045 ,  H04N1/00408 ,  H04N1/00588 ,  H04N2201/0094

Abstract: An electronic device is configured to acquire image data containing a test pattern including first and second patterns intersecting with each other. Pixels corresponding to the test pattern are determined by comparing brightness of each pixel with a threshold value, and widths of an overlapped image of the first and second patterns in an orthogonal direction at a plurality of different positions in the reference direction are calculated. Intersecting positions of the first pattern and the second pattern in the test pattern is detected based on a distribution of widths at the plurality of different positions. The test pattern has a model pattern having a set width in the orthogonal direction separate from the first and second patterns. The pixels corresponding to the test pattern are determined based on a threshold value, and widths at the plurality of positions of the overlapped image in the reference direction are calculated.