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公开(公告)号：US11639903B2
公开(公告)日：2023-05-02
申请号：US17322635
申请日：2021-05-17
Applicant: Battelle Memorial Institute
Inventor： Erin A. Miller , Richard E. Jacob , Nikhil S. Deshmukh , Cynthia L. Warner , Richard S. Wittman , Luke W. Campbell , Dustin M. Kasparek , Andy Gilbert , Stanley L. Owsley, Jr. , Kurt L. Silvers , Mital A. Zalavadia
IPC: G01N23/041 , G01N23/083 , G01N23/10 , A61B6/00 , A61B6/06 , G01N23/18
Abstract: Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.
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2.发明公开公开(公告)号：US20240298984A1
公开(公告)日：2024-09-12
申请号：US18655160
申请日：2024-05-03
Applicant: Battelle Memorial Institute
Inventor： Erin A. Miller , Dustin M. Kasparek , Luke W. Campbell
CPC classification number: A61B6/4291 , A61B6/4035 , A61B6/405 , A61B6/466 , A61B6/484
Abstract: A system includes an x-ray source configured to emit an x-ray beam along a beam path and through an object arranged for inspection in a field of view of the x-ray source; and an object grating, an analyzer grating, a detector grating, and a detector arranged with respect to each other in the field of view, wherein the object grating includes object grating elements arranged in a first pattern, the detector grating includes detector grating elements arranged in a second pattern that is separable from the first pattern, and the analyzer grating includes analyzer grating elements that are arranged to correspond to a combination of the first pattern and second pattern, wherein the analyzer grating, and/or the object grating and detector grating, are configured to move relative to each other to different phase positions, and wherein the detector is configured to collect indirect moiré image data of the object at the different phase positions.
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公开(公告)号：US20210349040A1
公开(公告)日：2021-11-11
申请号：US17322635
申请日：2021-05-17
Applicant: Battelle Memorial Institute
Inventor： Erin A. Miller , Richard E. Jacob , Nikhil S. Deshmukh , Cynthia L. Warner , Richard S. Wittman , Luke W. Campbell , Dustin M. Kasparek , Andy Gilbert , Stanley L. Owsley, JR. , Kurt L. Silvers , Mital A. Zalavadia
IPC: G01N23/041 , G01N23/083 , G01N23/10 , A61B6/00 , A61B6/06
Abstract: Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.
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