DATA PROCESSING METHOD AND DATA PROCESSING APPARATUS

    公开(公告)号:US20240193460A1

    公开(公告)日:2024-06-13

    申请号:US17908478

    申请日:2021-05-31

    IPC分类号: G06N20/00

    CPC分类号: G06N20/00

    摘要: A data processing method, includes: obtaining sample data in response to a user's input operation on a graphical interface, the sample data including characteristic data and detection data of samples; displaying a sample distribution diagram on the graphical interface based on the sample data; obtaining a focus threshold used for classifying positive and negative samples, the focus threshold being determined based on the detection data of the samples; displaying a mark of the focus threshold in the sample distribution diagram on the graphical interface; distinguishing data display effects of the positive and negative samples based on the focus threshold; and determining a cause of abnormality of the samples based on the positive and negative samples.

    METHOD, SYSTEM, DEVICE AND MEDIUM FOR QUERYING PRODUCT HISTORY

    公开(公告)号:US20220129447A1

    公开(公告)日:2022-04-28

    申请号:US17410723

    申请日:2021-08-24

    摘要: A method for querying a product history is disclosed. The method includes receiving a product query request including at least one product query parameter for a target product to a product graph database that stores a relational map constructed based on a manufacturing process of the target product and describing entities including product entities and manufacturing entities and entity relations therebetween involved in the manufacturing process, querying the product graph database according to the product query parameter to obtain product history data of the target product by searching for a product entity corresponding to the target product as a target product entity in the relational map according to the parameter, searching for associated manufacturing entities of the target product entity according to the entity relations, obtaining the product history data based on the associated manufacturing entities, and sending a notification message to notify obtained product history data.

    METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATION OF PRODUCT

    公开(公告)号:US20240094141A1

    公开(公告)日:2024-03-21

    申请号:US17765595

    申请日:2021-04-30

    IPC分类号: G01N21/95

    CPC分类号: G01N21/95 G01N2021/9511

    摘要: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

    DETERMINING CORRELATION DEGREE, APPARATUS, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM

    公开(公告)号:US20240296762A1

    公开(公告)日:2024-09-05

    申请号:US17919009

    申请日:2021-08-26

    IPC分类号: G09G3/00

    CPC分类号: G09G3/006 G09G2330/12

    摘要: A method for determining a correlation degree, an apparatus for determining a correlation degree, an electronic device, and a computer-readable storage medium. The method includes: acquiring measurement information and defect information on a display panel, wherein the measurement information includes a measurement value and a measurement location for a measurement indicator, and the defect information includes a defect type; determining an influence weight of the measurement indicator having the measurement value at the measurement location on the defect information of the defect type; and determining a correlation coefficient between the influence weight and the measurement value, and determining a correlation degree between the measurement information and the defect information according to the correlation coefficient. According to the method, it is beneficial to improve the accuracy and speed of analyzing the causes of defects, reduce the cost of analysis, improve the utilization rate of measurement information, and increase the worth of data.

    NORMALIZED PROCESSING METHOD AND APPARATUS OF NAMED ENTITY, AND ELECTRONIC DEVICE

    公开(公告)号:US20220129632A1

    公开(公告)日:2022-04-28

    申请号:US17506726

    申请日:2021-10-21

    摘要: A normalized processing method of a named entity includes: obtaining first text data; recognizing a named entity from the first text data; determining whether a first standard named entity exists in a standard named entity database according to the named entity; determining the first standard named entity as a normalized representation of the named entity in response to determining that the first standard named entity exists in the standard named entity database; and obtaining a second standard named entity from the standard named entity database and determining an obtained second standard named entity as the normalized representation of the named entity in response to determining that the first standard named entity does not exist in the standard named entity database.