DATA PROCESSING METHOD, DEVICE AND SYSTEM, AND ELECTRONIC DEVICE

    公开(公告)号:US20230004138A1

    公开(公告)日:2023-01-05

    申请号:US17781127

    申请日:2020-10-30

    IPC分类号: G05B19/406

    摘要: A data processing method includes: obtaining a defect type of a sample set in response to a first input of a user on a first interface, the sample set including samples, each sample having a first parameter used to represent a defect degree of the sample with regard to the defect type and a second parameter used to represent device informations of sample production devices through which the sample passes; calculating yield purity indexes of sample production devices on the samples based on first parameters and second parameters of the samples, so as to obtain influencing parameters of the sample production devices, an influencing parameter of each sample production device being used to represent an influence degree to which the sample production device affects an occurrence of the defect type on the samples; and displaying the influencing parameters of the sample production devices on a second interface.

    DATA PROCESSING METHOD AND DATA PROCESSING APPARATUS

    公开(公告)号:US20240193460A1

    公开(公告)日:2024-06-13

    申请号:US17908478

    申请日:2021-05-31

    IPC分类号: G06N20/00

    CPC分类号: G06N20/00

    摘要: A data processing method, includes: obtaining sample data in response to a user's input operation on a graphical interface, the sample data including characteristic data and detection data of samples; displaying a sample distribution diagram on the graphical interface based on the sample data; obtaining a focus threshold used for classifying positive and negative samples, the focus threshold being determined based on the detection data of the samples; displaying a mark of the focus threshold in the sample distribution diagram on the graphical interface; distinguishing data display effects of the positive and negative samples based on the focus threshold; and determining a cause of abnormality of the samples based on the positive and negative samples.

    METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATION OF PRODUCT

    公开(公告)号:US20240094141A1

    公开(公告)日:2024-03-21

    申请号:US17765595

    申请日:2021-04-30

    IPC分类号: G01N21/95

    CPC分类号: G01N21/95 G01N2021/9511

    摘要: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

    DETERMINING CORRELATION DEGREE, APPARATUS, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM

    公开(公告)号:US20240296762A1

    公开(公告)日:2024-09-05

    申请号:US17919009

    申请日:2021-08-26

    IPC分类号: G09G3/00

    CPC分类号: G09G3/006 G09G2330/12

    摘要: A method for determining a correlation degree, an apparatus for determining a correlation degree, an electronic device, and a computer-readable storage medium. The method includes: acquiring measurement information and defect information on a display panel, wherein the measurement information includes a measurement value and a measurement location for a measurement indicator, and the defect information includes a defect type; determining an influence weight of the measurement indicator having the measurement value at the measurement location on the defect information of the defect type; and determining a correlation coefficient between the influence weight and the measurement value, and determining a correlation degree between the measurement information and the defect information according to the correlation coefficient. According to the method, it is beneficial to improve the accuracy and speed of analyzing the causes of defects, reduce the cost of analysis, improve the utilization rate of measurement information, and increase the worth of data.

    DISPLAY PANEL AND DISPLAY APPARATUS
    7.
    发明公开

    公开(公告)号:US20240268184A1

    公开(公告)日:2024-08-08

    申请号:US18689978

    申请日:2022-05-31

    IPC分类号: H10K59/40 G06F3/044

    摘要: A display panel, including a base substrate, a display layer, and a touch-control layer that are sequentially stacked; where a display region of the display panel is provided with a light-transmitting region; the touch-control layer is provided with a touch-control channel, the touch-control channel comprises a first signal channel extending along a first direction and a second signal channel extending along second direction, and the second direction is intersected with the first direction; where, the touch-control channel adjacent to the light-transmitting region is a heterogeneous touch-control channel, and at least one heterogeneous touch-control channel comprises a plurality of heterogeneous touch-control sub-channels adjacent to the light-transmitting region; and among the plurality of heterogeneous touch-control sub-channels of the heterogeneous touch-control channel, at least one of the heterogeneous touch-control sub-channels is kept continuous.

    DISPLAY SUBSTRATE AND DISPLAY APPARATUS
    8.
    发明公开

    公开(公告)号:US20240237396A1

    公开(公告)日:2024-07-11

    申请号:US17922263

    申请日:2021-11-26

    摘要: A display substrate includes a substrate, a first conductive layer including a plurality of first signal lines, a first planarization layer and a plurality of anodes. An orthographic projection of at least one of the plurality of anodes on the substrate is non-overlapped with an orthographic projection of each first signal line on the substrate; and/or an orthographic projection of at least one of the plurality of anodes on the substrate is overlapped with an orthographic projection of one or more first signal lines on the substrate. In an anode and at least one first signal line whose orthographic projections on the substrate are overlapped, the at least one first signal line crosses a setting portion of the anode, so that by taking a center line of the anode in the first direction as an axis of symmetry, heights of the anode at symmetrical positions are substantially equal.