-
公开(公告)号:US07180297B2
公开(公告)日:2007-02-20
申请号:US11288697
申请日:2005-11-28
申请人: Bela Deak , Michael Edwards , Terry L. Elzy , Michael Gordon , Mahmoud Harmouch , Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Eugenio J. Tacconi
发明人: Bela Deak , Michael Edwards , Terry L. Elzy , Michael Gordon , Mahmoud Harmouch , Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Eugenio J. Tacconi
IPC分类号: G01R31/327
CPC分类号: G01R31/3278
摘要: A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.
摘要翻译: 提供了一种用于测试继电器的测试装置。 测试装置包括可移除地联接到底架的底盘和多个发电机部件。 多个发电机部件中的每一个具有信号发生器,用于促进由信号发生器产生的测试信号的CPU以及用于放大由信号发生器产生的信号的放大器。 测试装置还包括耦合以与多个发电机部件通信的控制器。
-
公开(公告)号:US07005856B2
公开(公告)日:2006-02-28
申请号:US10874458
申请日:2004-06-23
申请人: Bela Deak , Michael Edwards , Terry L. Elzy , Michael Gordon , Mahmoud Harmouch , Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Eugenio J. Tacconi
发明人: Bela Deak , Michael Edwards , Terry L. Elzy , Michael Gordon , Mahmoud Harmouch , Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Eugenio J. Tacconi
IPC分类号: H02H5/04
CPC分类号: G01R31/3278
摘要: A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.
-
公开(公告)号:US07415377B2
公开(公告)日:2008-08-19
申请号:US11776347
申请日:2007-07-11
申请人: Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Michael D. Willett , Michael Edwards , Terry L. Elzy , Michael Maahs , John L. Shanks , Stanley I. Thompson
发明人: Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Michael D. Willett , Michael Edwards , Terry L. Elzy , Michael Maahs , John L. Shanks , Stanley I. Thompson
IPC分类号: G06F19/00
CPC分类号: G01R31/3272 , Y10T307/25
摘要: A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
摘要翻译: 提供了一种用于测试继电器和控制系统的可编程系统。 在一个实施例中,本公开提供了一种能够例如测试继电器的可编程设备。 该装置包括用于产生信号以测试继电器的信号发生器。 该设备包括存储器位置和存储在存储器位置中的第一程序。 第一个程序支持继电器测试。 该装置包括用于支持中继测试的版本化程序,以及与信号发生器和存储器位置通信的处理器。 该设备还包括可由处理器操作的例程,以将替换第一程序的版本化程序安装在存储器位置中。
-
公开(公告)号:US07248986B2
公开(公告)日:2007-07-24
申请号:US10874969
申请日:2004-06-23
IPC分类号: G06F19/00
CPC分类号: G01R31/3272 , Y10T307/25
摘要: A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
摘要翻译: 提供了一种用于测试继电器和控制系统的可编程系统。 在一个实施例中,本公开提供了一种能够例如测试继电器的可编程设备。 该装置包括用于产生信号以测试继电器的信号发生器。 该设备包括存储器位置和存储在存储器位置中的第一程序。 第一个程序支持继电器测试。 该装置包括用于支持中继测试的版本化程序,以及与信号发生器和存储器位置通信的处理器。 该设备还包括可由处理器操作的例程,以将替换第一程序的版本化程序安装在存储器位置中。
-
-
-