THERMAL PROBE
    1.
    发明申请
    THERMAL PROBE 有权
    热探头

    公开(公告)号:US20130019353A1

    公开(公告)日:2013-01-17

    申请号:US13545647

    申请日:2012-07-10

    IPC分类号: G01Q60/58

    摘要: A thermal probe includes a support element, a conductive pattern and a tip. The support element has a slit or a through hole and has a first surface and a second surface which is opposite to the first surface. The conductive pattern is disposed at the first surface. The tip has a base and a pinpoint. The pinpoint is disposed at the base and passes through the slit or the through hole and highlights from the first surface. The base is connected with the second surface. The tip of the thermal probe of the invention can be replaced, and user can choose the best combination of the tip, conductive pattern and support element according to their needs.

    摘要翻译: 热探针包括支撑元件,导电图案和尖端。 支撑元件具有狭缝或通孔,并且具有与第一表面相对的第一表面和第二表面。 导电图案设置在第一表面。 尖端具有基部和精确点。 精确位置设置在基座处并穿过狭缝或通孔并从第一表面突出。 基座与第二表面相连。 可以更换本发明的热探针的尖端,用户可以根据需要选择尖端,导电图案和支撑元件的最佳组合。

    Thermal probe
    2.
    发明授权
    Thermal probe 有权
    热探头

    公开(公告)号:US08578511B2

    公开(公告)日:2013-11-05

    申请号:US13545647

    申请日:2012-07-10

    摘要: A thermal probe includes a support element, a conductive pattern and a tip. The support element has a slit or a through hole and has a first surface and a second surface which is opposite to the first surface. The conductive pattern is disposed at the first surface. The tip has a base and a pinpoint. The pinpoint is disposed at the base and passes through the slit or the through hole and highlights from the first surface. The base is connected with the second surface. The tip of the thermal probe of the invention can be replaced, and user can choose the best combination of the tip, conductive pattern and support element according to their needs.

    摘要翻译: 热探针包括支撑元件,导电图案和尖端。 支撑元件具有狭缝或通孔,并且具有与第一表面相对的第一表面和第二表面。 导电图案设置在第一表面。 尖端具有基部和精确点。 精确位置设置在基座处并穿过狭缝或通孔并从第一表面突出。 基座与第二表面相连。 可以更换本发明的热探针的尖端,用户可以根据需要选择尖端,导电图案和支撑元件的最佳组合。

    Thermal probe
    3.
    发明授权
    Thermal probe 有权
    热探头

    公开(公告)号:US08595861B2

    公开(公告)日:2013-11-26

    申请号:US13475806

    申请日:2012-05-18

    IPC分类号: G01Q60/58

    CPC分类号: G01Q60/58 Y10S977/867

    摘要: A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.

    摘要翻译: 热探针包括支撑元件,导电图案和尖端。 导电图案设置在支撑元件处并且具有多个弯曲部分。 尖端具有基部和精确点。 底座具有与第一表面相对的第一表面和第二表面。 精确位置设置在第一表面。 第二表面与导电图案连接。 弯曲部分与第一表面接触。 热敏探头的尖端是可更换的,用户可以根据需要选择尖端,导电图案和支撑元件的最佳组合。