公开(公告)号：US20080062510A1

公开(公告)日：2008-03-13

申请号：US11759188

申请日：2007-06-06

申请人： Burkhard Spill ,  Wolfgang Vollrath ,  Maximilian Dobler

发明人： Burkhard Spill ,  Wolfgang Vollrath ,  Maximilian Dobler

IPC分类号： G02B21/00 ,  G01J3/28

CPC分类号： G02B21/06 ,  G02B21/16

摘要： A method is disclosed for selecting a minimum of one wavelength 320 or a minimum of one wavelength range 206 of electromagnetic radiation to be used for object testing, whereby a first spectrum is captured or calculated on a first point of a first object 509, a second spectrum is captured or calculated on a second point of the first 509 or a second object, a difference spectrum is formed from the first and the second spectrum, and the minimum of one wavelength 320 or minimum of one wavelength range 26 is selected in the difference spectrum according to predetermined criteria; as well as a microscope 500 with means of the illumination 502, capture 503, and analysis 504, whereby the illumination means illuminate an object 509, and the capture means capture a first spectrum on a first point on a first object, the capture means capture a second spectrum on a second point of the first or on a second object, and the analysis means form a difference spectrum as a difference between the first and the second spectrum. The disclosed invention enables selection of an optimally suited wavelength for object testing.

摘要翻译： 公开了一种用于选择要用于对象测试的电磁辐射的一个波长320或最小一个波长范围206的最小值的方法，由此在第一对象509的第一点上捕获或计算第一光谱，第二光谱 在第一个509或第二个物体的第二个点上捕获或计算光谱，从第一和第二光谱形成差分光谱，并且在差异中选择一个波长320或最小值一个波长范围26的最小值 频谱根据预定标准; 以及具有照明502，捕获503和分析504的装置的显微镜500，由此照明装置照射物体509，并且捕获装置在第一物体上的第一点捕获第一光谱，捕获装置捕获 在第一或第二物体的第二点上的第二光谱，并且分析装置形成差光谱作为第一和第二光谱之间的差。 所公开的发明使得能够选择用于对象测试的最适合的波长。