METHODS FOR FORMING CAPACITOR STRUCTURES
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    发明申请
    METHODS FOR FORMING CAPACITOR STRUCTURES 有权
    形成电容器结构的方法

    公开(公告)号:US20080299723A1

    公开(公告)日:2008-12-04

    申请号:US11757763

    申请日:2007-06-04

    IPC分类号: H01L21/82

    CPC分类号: H01L27/0629 H01L29/7833

    摘要: A method for forming a capacitor includes forming a dielectric layer over a substrate. A conductive layer is formed over the dielectric layer. Dopants are implanted through at least one of the dielectric layer and the conductive layer after forming the dielectric layer so as to form a conductive region under the dielectric layer, wherein the conductive layer is a top electrode of the capacitor and the conductive region is a bottom electrode of the capacitor.

    摘要翻译: 形成电容器的方法包括在衬底上形成电介质层。 在电介质层上形成导电层。 在形成电介质层之后,通过介电层和导电层中的至少一个注入掺杂剂,以在电介质层下方形成导电区域,其中导电层是电容器的顶部电极,导电区域是底部 电容器的电极。