公开(公告)号：US20240288350A1

公开(公告)日：2024-08-29

申请号：US18586507

申请日：2024-02-25

申请人： CORNING INCORPORATED

发明人： Nicholas Robert Bonham ,  Yu Cheng ,  Rachid Gafsi ,  Kurt Edward Gerber ,  Paul M Giglio ,  Suresh Thakordas Gulati ,  Fang-Yu Hsu ,  Te Heng Hung ,  Weirong Jiang ,  Cheng Yu Lai ,  Peter Joseph Lezzi ,  Jody Paul Markley, JR. ,  Arpita Mitra ,  Douglas Miles Noni ,  Samuel Odei Owusu ,  Timothy Paul Smith ,  Ryan Christopher Sutton ,  Jamie Todd Westbrook

IPC分类号： G01N3/20 ,  G01N3/02

CPC分类号： G01N3/20 ,  G01N3/02

摘要： Disclosed herein are testing apparatuses for testing stresses in substrates. The testing apparatus includes a base, a first plate coupled to the base, the first plate being movable relative to the base along a first axis, a second plate coupled to the base, the second plate being movable relative to the base and relative to the first plate along a second axis that is perpendicular to the first axis, a first actuator operable to move the first plate along the first axis towards or away from the second plate, a second actuator operable to move the second plate along the second axis relative to the first plate, and a controller operatively connected to the first actuator and the second actuator operable to control movement of the first plate and the second plate.