公开(公告)号：US20170052298A1

公开(公告)日：2017-02-23

申请号：US15118633

申请日：2015-02-12

Applicant: Corning Incorporated

Inventor： Jaymin Amin ,  Raymond Geroe Greene ,  Tomohiro Ishikawa ,  Jum Sik Kim ,  Cheng-Chung Li ,  Michal Mlejnek ,  Tina Marie Proulx

IPC: G02B5/23 ,  H01L51/52 ,  G02F1/1335 ,  H01L27/32 ,  G02B1/11 ,  G02B5/20

CPC classification number: G02B5/23 ,  G02B1/11 ,  G02B5/205 ,  G02F1/133509 ,  G02F2001/133562 ,  G02F2202/14 ,  H01L27/3232 ,  H01L51/5281

Abstract: Systems and methods for ambient-light reduction in display systems with OLED or LCD based displays are disclosed. The base display is interfaced with an ambient-light-reducing (ALR) structure to form the display system. The ALR structure includes an ALR component. The ALR component can be a photochromic component or a fixed neutral-density component. The ALR structure attenuates incoming ambient light as well as outgoing redirected ambient light that is generated within the base display and is then emitted from the display system into the ambient environment. This increases the ambient contrast relative to that of the base display alone.

Abstract translation: 公开了具有OLED或LCD显示器的显示系统中的环境光减少的系统和方法。 基座显示器与环境光降低（ALR）结构接口以形成显示系统。 ALR结构包括ALR组件。 ALR组分可以是光致变色组分或固定的中性密度组分。 ALR结构衰减入射环境光以及在基本显示器内产生的出射重定向环境光，然后从显示系统发射到周围环境中。 这相对于基本显示器的环境对比度增加。

公开(公告)号：US20200150057A1

公开(公告)日：2020-05-14

申请号：US16683359

申请日：2019-11-14

Applicant: CORNING INCORPORATED

Inventor： Raymond Geroe Greene ,  Tomohiro Ishikawa ,  Rohit Rai ,  Seungcheol Yang

IPC: G01N21/958 ,  G01M11/02 ,  G01N21/88

Abstract: Systems and methods for evaluating glass-based substrates for birefringence defects are disclosed. In a one embodiment, a method includes generating an image of the at least one glass-based substrate, and determining at least one transmission curve, wherein the transmission curve plots transmission values versus position along the at least one line. The method further includes determining a defect metric from the at least one transmission curve. The method also includes comparing the defect metric to at least one standard.