公开(公告)号：US5644610A

公开(公告)日：1997-07-01

申请号：US690810

申请日：1996-08-01

申请人： Carl R. Crawford ,  Christopher C. Ruth ,  Iouri Bachilov ,  Ruvin Deych

发明人： Carl R. Crawford ,  Christopher C. Ruth ,  Iouri Bachilov ,  Ruvin Deych

IPC分类号： G06T11/00 ,  A61B6/03

CPC分类号： G06T11/005 ,  Y10S378/901

摘要： The disclosed CT scanner includes a tomography system for generating data during a scan. The tomography system includes a detector characterized by at least one afterglow amplitude and at least one afterglow time constant, and a sampling device for generating a plurality of samples x.sub.i for all i from zero to MAX minus one of the detector output signal. The scanner also includes a set of N sub-processors for processing the samples x.sub.i, each of the sub-processors being represented by a unique integer q selected from zero to N minus one and receiving only the samples X.sub.iN+q. Each sub-processor includes a device for generating a compensated signal according to a function of at least a portion of the received samples and parameters representative of the afterglow amplitude and the afterglow time constant.

摘要翻译： 所公开的CT扫描仪包括用于在扫描期间产生数据的断层摄影系统。 该断层摄影系统包括一个检测器，其特征在于至少有一个余辉振幅和至少一个余辉时间常数，以及采样装置，用于产生从0到MAX减去检测器输出信号之一的所有i的多个采样xi。 扫描器还包括用于处理样本xi的一组N个子处理器，每个子处理器由从零到N减去一个并且仅接收样本XiN + q的独特整数q表示。 每个子处理器包括用于根据所接收的采样的至少一部分的功能和表示余辉振幅和余辉时间常数的参数产生补偿信号的装置。

公开(公告)号：US10429520B2

公开(公告)日：2019-10-01

申请号：US14403282

申请日：2012-05-22

申请人： Ruvin Deych ,  Ben Tuval

发明人： Ruvin Deych ,  Ben Tuval

IPC分类号： G01T1/24 ,  G01T1/20 ,  H01L27/146 ,  H01L23/498

摘要： The present disclosure includes multiple ways of providing photodetector interconnectivity using, for example: a) single-layered thick or thin film ceramic substrate to change a node pitch from one facing to another, and/or b) direct bonding of photodiode circuit to a flex cable interconnect.

公开(公告)号：US07431500B2

公开(公告)日：2008-10-07

申请号：US10814992

申请日：2004-03-31

申请人： Ruvin Deych ,  Bernard M. Gordon ,  Oscar Khutoryansky

发明人： Ruvin Deych ,  Bernard M. Gordon ,  Oscar Khutoryansky

IPC分类号： G01D18/00 ,  G01N23/083 ,  H05G1/64 ,  H05G1/32

CPC分类号： A61B6/502 ,  A61B6/4035 ,  A61B6/482 ,  A61B6/488 ,  A61B6/542 ,  A61B6/544 ,  G01J1/429

摘要： A method and system is presented in radiography for optimizing image quality of an object (e.g. an anatomical region of a patient), while minimizing the radiation dose to the patient. X-ray exposure parameters, such as operating voltage (kVp), operating current (mA), focal spot size, and soft x-ray filter combination, are dynamically controlled during the x-ray exposure. During at least two different sampling intervals and at two different kVp levels, x-rays are passed through the object, and detected by sensors located between the object and the image plane. After the last sampling interval, the sensor output signals and the measured thickness of the object are used to evaluate the optimal settings for the x-ray exposure parameters. The x-ray exposure parameters are set to these optimal settings for the remainder of the exposure period.

摘要翻译： 在用于优化对象（例如患者的解剖区域）的图像质量的放射线照相中呈现方法和系统，同时使对患者的辐射剂量最小化。 在X射线曝光期间动态控制X射线曝光参数，例如工作电压（kVp），工作电流（mA），焦点尺寸和软x射线滤光器组合。 在至少两个不同的采样间隔和两个不同的kVp级别，x射线通过物体，并由位于物体和像面之间的传感器检测。 在最后一个采样间隔之后，传感器输出信号和物体的测量厚度用于评估x射线曝光参数的最佳设置。 在曝光期间的其余部分，将x射线曝光参数设置为这些最佳设置。

公开(公告)号：US20130121475A1

公开(公告)日：2013-05-16

申请号：US13386278

申请日：2009-07-21

申请人： Ruvin Deych ,  Ben Tuval

发明人： Ruvin Deych ,  Ben Tuval

IPC分类号： G21K1/00

CPC分类号： G21K1/00 ,  G21K1/025

摘要： Anti-scatter plates are used to attenuate secondary radiation so that it is not detected by a detector array. However, anti-scatter plates often cast dynamic shadows on the detector array which results in noise in signals produced by the detector array. As disclosed herein, an anti-scatter grid comprises at least two anti-scatter plates. A percentage difference in the shadows cast by the first and the second anti-scatter plates is substantially zero (e.g., causing uniform percentage change in shadows cast on the detector array). Additionally, the shadows that are cast by the anti-scatter plates may be substantially static. In one embodiment, this is accomplished by having a top surface of an anti-scatter plate that has a transverse dimension that is less than a bottom surface of the anti-scatter plate.

摘要翻译： 防散射板用于衰减二次辐射，使其不被检测器阵列检测。 然而，防散射板通常在检测器阵列上施加动态阴影，导致由检测器阵列产生的信号中的噪声。 如本文所公开的，防散射格栅包括至少两个防散射板。 由第一和第二防散射板投射的阴影的百分比差异基本上为零（例如，导致在检测器阵列上施加的阴影中的均匀百分比变化）。 另外，由防散射板施加的阴影可以是基本静态的。 在一个实施例中，这通过具有防散射板的顶表面的横向尺寸小于防散射板的底表面来实现。

公开(公告)号：US20120056092A1

公开(公告)日：2012-03-08

申请号：US12874408

申请日：2010-09-02

申请人： Ruvin Deych ,  Charles Shaughnessy

发明人： Ruvin Deych ,  Charles Shaughnessy

IPC分类号： G01T1/20 ,  G01T1/24

CPC分类号： G01T1/17 ,  G01T7/005

摘要： Among other things, one or more systems and/or techniques for integrating electrical charge yielded from an indirect conversion detector array of a pulsating radiation system are provided. The integration begins during a resting period between a first and second pulse and ends before the second pulse is emitted. Electrical charge that is measured during a resting period is integrated, while electrical charge measured during a pulse is not integrated. In this way, parasitic contributions caused by the direct interaction of radiation photons with a photodiode are reduced and a quantum efficiency of the indirect conversion detector array is increased, for example. Moreover, the period of integration can be adjusted such that a voltage gain related to the indirect conversion detector array can be varied to a predetermined level.

摘要翻译： 提供了一种或多种用于积分从脉动辐射系统的间接转换检测器阵列产生的电荷的系统和/或技术。 积分在第一和第二脉冲之间的静止期间开始，并且在第二脉冲发射之前结束。 在静止期间测量的电荷被积分，而在脉冲期间测量的电荷未被积分。 以这种方式，减少了由辐射光子与光电二极管的直接相互作用引起的寄生贡献，并且例如间接转换检测器阵列的量子效率增加。 此外，可以调节积分周期，使得与间接转换检测器阵列相关的电压增益可以变化到预定水平。

公开(公告)号：US5781606A

公开(公告)日：1998-07-14

申请号：US687747

申请日：1996-07-25

申请人： John Dobbs ,  Ruvin Deych

发明人： John Dobbs ,  Ruvin Deych

IPC分类号： A61B6/03 ,  G01T1/29 ,  A61B6/06

CPC分类号： A61B6/587 ,  A61B6/032 ,  A61B6/06 ,  A61B6/4078 ,  A61B6/4411 ,  G01T1/2985

摘要： In an x-ray scanning system having an x-ray source and an x-ray detector assembly, including a plurality of x-ray detector crystals grouped in substantially linear arrays and cooperative with the x-ray source, a substantially continuous radiation detection zone is established by positioning the detector arrays so that substantially all radiation from the source passing through the detector assembly passes through at least a portion of at least one detector crystal. The detector arrays are tilted at a preselected angle .alpha. with respect to a nominally perpendicular orientation relative to radial lines extending from the focal spot, so that the spaces between adjacent detector crystals in an array are not aligned with x-rays emanating from the x-ray source. The angle .alpha. is a function of the geometry of the detector crystals and the spaces between adjacent crystals in an array.

摘要翻译： 在具有X射线源和X射线检测器组件的X射线扫描系统中，包括以基本线性阵列分组并与X射线源协作的多个X射线检测器晶体，基本上连续的辐射检测区 通过定位检测器阵列来建立，使得来自穿过检测器组件的源的基本上所有的辐射通过至少一个检测器晶体的至少一部分。 检测器阵列相对于从焦点延伸的径向线相对于标称垂直取向以预选的角度α倾斜，使得阵列中的相邻检测器晶体之间的空间不与从x射线发射的x射线对准， 射线源。 角度α是检测器晶体的几何形状和阵列中相邻晶体之间的空间的函数。

公开(公告)号：US08558180B2

公开(公告)日：2013-10-15

申请号：US12874408

申请日：2010-09-02

申请人： Ruvin Deych ,  Charles Shaughnessy

发明人： Ruvin Deych ,  Charles Shaughnessy

IPC分类号： G01T1/20 ,  G01T1/24 ,  G01T1/26 ,  H05G1/64 ,  H05G1/22

CPC分类号： G01T1/17 ,  G01T7/005

摘要： Among other things, one or more systems and/or techniques for integrating electrical charge yielded from an indirect conversion detector array of a pulsating radiation system are provided. The integration begins during a resting period between a first and second pulse and ends before the second pulse is emitted. Electrical charge that is measured during a resting period is integrated, while electrical charge measured during a pulse is not integrated. In this way, parasitic contributions caused by the direct interaction of radiation photons with a photodiode are reduced and a quantum efficiency of the indirect conversion detector array is increased, for example. Moreover, the period of integration can be adjusted such that a voltage gain related to the indirect conversion detector array can be varied to a predetermined level.

摘要翻译： 提供了一种或多种用于积分从脉动辐射系统的间接转换检测器阵列产生的电荷的系统和/或技术。 积分在第一和第二脉冲之间的静止期间开始，并且在第二脉冲发射之前结束。 在静止期间测量的电荷被积分，而在脉冲期间测量的电荷未被积分。 以这种方式，减少了由辐射光子与光电二极管的直接相互作用引起的寄生贡献，并且例如间接转换检测器阵列的量子效率增加。 此外，可以调节积分周期，使得与间接转换检测器阵列相关的电压增益可以变化到预定水平。

公开(公告)号：US20070158573A1

公开(公告)日：2007-07-12

申请号：US11329658

申请日：2006-01-11

申请人： Ruvin Deych

发明人： Ruvin Deych

IPC分类号： G01T1/20

CPC分类号： G01T1/2018 ,  G01T1/2985

摘要： A dual-energy x-ray detector includes a plurality of x-ray detector elements that detect x-rays that are generated by an x-ray source and that have passed through an object. Each of the x-ray detector elements includes a first scintillator layer adapted to convert x-rays from the x-ray source that have passed through the object into light of a first wavelength, and a second scintillator layer positioned behind the first scintillator layer and adapted to convert x-rays from the x-ray source that have passed through the object and through the first scintillator layer into light of a second wavelength. Each of the x-ray detector elements further includes a first optical sensor having a spectral sensitivity substantially matched to light of the first wavelength, and a second optical sensor having a spectral sensitivity substantially matched to light of the second wavelength.

摘要翻译： 双能X射线检测器包括多个x射线检测器元件，其检测由x射线源产生并且已经通过物体的x射线。 每个X射线检测器元件包括适于将来自已经通过物体的x射线的x射线转换成第一波长的光的第一闪烁体层和位于第一闪烁体层后面的第二闪烁体层，以及 适于将来自已经穿过物体的X射线源的X射线转换成通过第一闪烁体层的X射线转换成第二波长的光。 每个X射线检测器元件还包括具有与第一波长的光基本匹配的光谱灵敏度的第一光学传感器和具有与第二波长的光基本上匹配的光谱灵敏度的第二光学传感器。

公开(公告)号：US6094469A

公开(公告)日：2000-07-25

申请号：US176444

申请日：1998-10-21

申请人： John Dobbs ,  Ruvin Deych ,  James Bowers

发明人： John Dobbs ,  Ruvin Deych ,  James Bowers

IPC分类号： A61B6/03 ,  A61B6/00 ,  G01N23/04 ,  H05G1/02

CPC分类号： A61B6/583 ,  A61B6/4021 ,  G01N23/04 ,  H05G1/02 ,  Y10S378/901

摘要： A computed tomography system having a fourfold improvement in both short-and long-term beam position stability. A beam-position detector is located at a peripheral edge of the primary fan beam and is fixed relative to the primary detectors so as to indicate beam position on the primary detectors. The beam-position detector is oriented so that its maximum sensitivity to beam motion is in the direction of beam movement due to focal spot drift due to thermal effects and gravity. Short-term focal spot drift is detected by a secondary beam out of the primary fan beam and is corrected in real time by adjusting the position of a collimator for the primary beam. Long-term changes in the focal spot position are corrected by using information from the beam-position detector to recalibrate the focal spot-beam collimator data set.

摘要翻译： 一种计算机断层摄影系统在短波长和长波束位置稳定性方面具有四倍的改善。 光束位置检测器位于主风扇光束的外围边缘处，并且相对于主检测器固定，以便指示主检测器上的光束位置。 光束位置检测器被定向成使得由于热效应和重力引起的焦斑漂移，其对光束运动的最大灵敏度在光束移动的方向上。 通过次级光束从主风扇光束中检测出短焦点漂移，并通过调整主光束的准直仪的位置实时校正。 通过使用来自光束位置检测器的信息来校正焦斑位置的长期变化，以重新校准焦点光束准直仪数据集。

公开(公告)号：US5757878A

公开(公告)日：1998-05-26

申请号：US698717

申请日：1996-08-16

申请人： John Dobbs ,  Ruvin Deych

发明人： John Dobbs ,  Ruvin Deych

IPC分类号： A61B6/03

CPC分类号： A61B6/032

摘要： In an x-ray scanning system having an x-ray source and a plurality of x-ray detectors mounted in substantially linear arrays and positioned along an arc extending about a focal spot defined by the x-ray source, the placement of the arrays along the arc is optimized to substantially avoid interfering contact between adjacent arrays. Each detector array is located at a preselected radial distance from the focal spot and oriented at a preselected angle with respect to radial lines extending from the focal spot so that the radiation-insensitive end portions of adjacent arrays overlap in the tangential direction. The tangential spacing between adjacent detector arrays is thus approximately equal to the tangential spacing between adjacent detectors in a single array.

摘要翻译： 在具有x射线源和多个x射线检测器的X射线扫描系统中，其安装成基本上线性的阵列并且沿着围绕由x射线源限定的焦斑延伸的弧定位，阵列沿着 电弧被优化以基本上避免相邻阵列之间的干扰接触。 每个检测器阵列位于距离焦斑的预选的径向距离处，并相对于从焦点延伸的径向线以预选的角度定向，使得相邻阵列的辐射不敏感端部在切线方向上重叠。 因此，相邻检测器阵列之间的切向间距大致等于单个阵列中相邻检测器之间的切线间距。