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公开(公告)号:US09658047B2
公开(公告)日:2017-05-23
申请号:US14521867
申请日:2014-10-23
申请人: Caterpillar Inc.
摘要: A system is disclosed for use in measuring a component. The system may have a probe configured to generate signals associated with a proximity to actual target points of the component, an actuator configured to move the probe relative to the component, and a controller in communication with the probe and the actuator. The controller may be configured to receive coordinates of intended form target points, to determine coordinates of the actual target points of the component relative to a component datum based on the signals, and to make a comparison of the coordinates of the intended form target points and the coordinates of the actual target points. The controller may also be configured to generate a deviation report based on the comparison, and to filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to component specification requirements of the component.
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公开(公告)号:US10401845B2
公开(公告)日:2019-09-03
申请号:US14988381
申请日:2016-01-05
申请人: Caterpillar Inc.
IPC分类号: G05B19/418
摘要: A system is provided for manufacturing a component within a factory. The system may have an autonomous vehicle configured to transport the component to an area within an open space of the factory and to secure the component at the area during processing of a designated volume of the component. The system may also have a plurality of processing modules each configured to process a portion of the component less than a whole of the designated volume, and a controller in communication with the autonomous vehicle and the plurality of processing modules. The controller may be configured to coordinate operations of the plurality of processing modules according to a programmed process plan.
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公开(公告)号:US09879968B2
公开(公告)日:2018-01-30
申请号:US14708728
申请日:2015-05-11
申请人: Caterpillar Inc.
摘要: A system is disclosed for measuring a feature of a component. The system may have a probe with a tip, and a sensing element configured to generate signals associated with a proximity of the tip to the feature. The system may also have an actuator configured to move the probe relative to the component, and a controller in communication with the sensing element and the actuator. The controller may be configured to generate a deviation report based on the signals, and to filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to specification requirements of the component. The plurality of deviation categories may include at least a waviness category. The controller may also be configured to determine a change to a process used to fabricate the component based on the information from the deviation report filtered into the waviness category.
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