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公开(公告)号:US20210328564A1
公开(公告)日:2021-10-21
申请号:US17232088
申请日:2021-04-15
申请人: Chao Chen , Youn-Jae Kook , Jihee Lee , Kailiang Chen , Leung Kin Chiu , Joseph Lutsky , Nevada J. Sanchez , Sebastian Schaetz , Hamid Soleimani
发明人: Chao Chen , Youn-Jae Kook , Jihee Lee , Kailiang Chen , Leung Kin Chiu , Joseph Lutsky , Nevada J. Sanchez , Sebastian Schaetz , Hamid Soleimani
摘要: Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.
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公开(公告)号:US20210325349A1
公开(公告)日:2021-10-21
申请号:US17232100
申请日:2021-04-15
申请人: Chao Chen , Youn-Jae Kook , Jihee Lee , Kailiang Chen , Leung Kin Chiu , Joseph Lutsky , Nevada J. Sanchez , Sebastian Schaetz , Hamid Soleimani
发明人: Chao Chen , Youn-Jae Kook , Jihee Lee , Kailiang Chen , Leung Kin Chiu , Joseph Lutsky , Nevada J. Sanchez , Sebastian Schaetz , Hamid Soleimani
摘要: Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.
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