公开(公告)号：US20060125496A1

公开(公告)日：2006-06-15

申请号：US11010074

申请日：2004-12-10

申请人： Chris Jacobsen ,  Kenneth Parker ,  John Herczeg

发明人： Chris Jacobsen ,  Kenneth Parker ,  John Herczeg

IPC分类号： G01R31/02

CPC分类号： G01R31/2818 ,  H05K1/0268 ,  H05K3/0005

摘要： Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probe insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred and alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations such that tips of said respective fixture probes exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.

摘要翻译： 介绍了在印刷电路板（PCB）设计中自动化测试垫插入和PCB测试仪夹具中夹具探针插入的技术。 探针定位算法可预测地确定与PCB设计中的多个相应网络相关联的各组潜在探测位置中的各个优选探测位置。 优选地以珠探针的形式的测试垫在相应的优选探测位置附加到PCB设计中，并且在可行的情况下，从相应的潜在探测位置集合中的剩余的探测位置中选择一个或多个替代探测位置。 在夹具设计期间，在PCB设计中实现的具有多个测试焊盘的网络通过在PCB设计期间使用的相同探针位置算法来处理，以确定用于所述各个网络的相关联的优选和替代探测位置。 夹具探针优选地以相应的优选探测位置插入到PCB测试器夹具设计中，使得如果将PCB安装在印刷电路中，则所述相应夹具探针的尖端与根据PCB设计实现的PCB的相应优选测试垫精确对准 按照PCB测试仪器设计实现板测试仪。

公开(公告)号：US20060129955A1

公开(公告)日：2006-06-15

申请号：US11009117

申请日：2004-12-10

申请人： Chris Jacobsen ,  Kenneth Parker ,  John Herczeg

发明人： Chris Jacobsen ,  Kenneth Parker ,  John Herczeg

IPC分类号： G06F17/50 ,  G01R31/02

CPC分类号： H05K3/0005 ,  H05K1/0268 ,  H05K2203/162

摘要： Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probes insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred probing location and any associated alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations to exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.

摘要翻译： 介绍了在印刷电路板（PCB）设计中自动化测试垫插入和在PCB测试仪夹具中插入夹具探针的技术。 探针定位算法可预测地确定与PCB设计中的多个相应网络相关联的各组潜在探测位置中的各个优选探测位置。 优选地以珠探针的形式的测试垫在相应的优选探测位置附加到PCB设计中，并且在可行的情况下，从相应的潜在探测位置集合中的剩余的探测位置中选择一个或多个替代探测位置。 在夹具设计期间，在PCB设计中实现的具有多个测试焊盘的网络通过在PCB设计期间使用的相同的探针位置算法进行处理，以确定相关联的优选探测位置和用于所述各个网络的任何相关联的替代探测位置。 夹具探针优选地插入到PCB测试器夹具设计中，在相应的优选探测位置处，以便在PCB被安装在根据PCB的印刷电路板测试夹具中时，根据PCB设计实现的PCB的相应优选测试焊盘精确地对准 PCB测试仪器设计。