公开(公告)号：US20060197539A1

公开(公告)日：2006-09-07

申请号：US11069406

申请日：2005-03-01

申请人： Myron Schneider ,  Kenneth Parker ,  Chris Jacobsen

发明人： Myron Schneider ,  Kenneth Parker ,  Chris Jacobsen

IPC分类号： G01R31/04

CPC分类号： G01R31/312

摘要： A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal, and capacitively sensing a signal on a second node of the electrical device that is capacitively coupled to the node-under-implicit-test. A defect condition such as a short or open can be determined from the capacitively sensed signal.

摘要翻译： 提出了一种用于测试电气设备的隐式节点下的缺陷状况的方法。 根据本发明的技术包括利用已知的源信号刺激电容耦合到隐式测量节点的电气设备的第一节点，并电容地感测电容性的电子设备的第二节点上的信号 耦合到隐式测试节点。 诸如短路或开路的缺陷状况可以从电容感测信号确定。

公开(公告)号：US20070013772A1

公开(公告)日：2007-01-18

申请号：US11401240

申请日：2006-04-10

申请人： Yew Tham ,  Wee Yong ,  Chris Jacobsen

发明人： Yew Tham ,  Wee Yong ,  Chris Jacobsen

IPC分类号： H04N7/18 ,  H04N9/47

CPC分类号： G01N21/95684 ,  G01N21/95607 ,  G01N2021/95638 ,  G01N2021/95646 ,  G01R31/2808 ,  G01R31/2812 ,  G01R31/2813 ,  G01R31/309 ,  G01R31/31905

摘要： An in-circuit test fixture performs both electrical tests on a Printed Circuit Assembly (“PCA”) and reads distinguishing features of a feature of interest of the PCA. The in-circuit test fixture physically supports an image sensor array. A light focusing means has a position relative to the distinguishing features and the image sensor such that a focused real image of the distinguishing features is imaged onto the image sensor. The image sensor outputs image information of the distinguishing features. A processor performs image analysis based on the image information of the distinguishing features to determine if defects exist.

摘要翻译： 在线测试夹具在印刷电路组件（“PCA”）上执行电气测试，并读取PCA感兴趣特征的区别特征。 在线测试夹具物理上支持图像传感器阵列。 光聚焦装置具有相对于区别特征和图像传感器的位置，使得区分特征的聚焦实像被成像到图像传感器上。 图像传感器输出区别特征的图像信息。 处理器基于识别特征的图像信息执行图像分析，以确定是否存在缺陷。

公开(公告)号：US20070007978A1

公开(公告)日：2007-01-11

申请号：US11470344

申请日：2006-09-06

申请人： Kenneth Parker ,  Chris Jacobsen ,  Myron Schneider

发明人： Kenneth Parker ,  Chris Jacobsen ,  Myron Schneider

IPC分类号： G01R31/02

CPC分类号： G01R31/312 ,  G01R31/026 ,  G01R31/046

摘要： A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a non-contact connector test probe for a testing a connector of the circuit assembly. A method for testing continuity of electrical paths through a circuit assembly is presented. In the method, one or more nodes of the circuit assembly are stimulated, connector pins of a connector on the circuit assembly are capacitively coupled to a non-contact connector test probe, and an electrical characteristic is measured by a tester coupled to the non-contact connector test probe to determine continuity of electrical paths through the circuit assembly.

摘要翻译： 提出了一种能够通过电路组件测试电气路径的装置。 该装置可以包括用于测试电路组件的连接器的非接触式连接器测试探头。 提出了一种用于测试通过电路组件的电气路径的连续性的方法。 在该方法中，电路组件的一个或多个节点被激励，电路组件上的连接器的连接器引脚电容耦合到非接触式连接器测试探针，并且电特性由耦合到非接触式连接器的测试仪测量， 接触连接器测试探头，以确定通过电路组件的电气路径的连续性。

公开(公告)号：US20060125496A1

公开(公告)日：2006-06-15

申请号：US11010074

申请日：2004-12-10

申请人： Chris Jacobsen ,  Kenneth Parker ,  John Herczeg

发明人： Chris Jacobsen ,  Kenneth Parker ,  John Herczeg

IPC分类号： G01R31/02

CPC分类号： G01R31/2818 ,  H05K1/0268 ,  H05K3/0005

摘要： Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probe insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred and alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations such that tips of said respective fixture probes exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.

摘要翻译： 介绍了在印刷电路板（PCB）设计中自动化测试垫插入和PCB测试仪夹具中夹具探针插入的技术。 探针定位算法可预测地确定与PCB设计中的多个相应网络相关联的各组潜在探测位置中的各个优选探测位置。 优选地以珠探针的形式的测试垫在相应的优选探测位置附加到PCB设计中，并且在可行的情况下，从相应的潜在探测位置集合中的剩余的探测位置中选择一个或多个替代探测位置。 在夹具设计期间，在PCB设计中实现的具有多个测试焊盘的网络通过在PCB设计期间使用的相同探针位置算法来处理，以确定用于所述各个网络的相关联的优选和替代探测位置。 夹具探针优选地以相应的优选探测位置插入到PCB测试器夹具设计中，使得如果将PCB安装在印刷电路中，则所述相应夹具探针的尖端与根据PCB设计实现的PCB的相应优选测试垫精确对准 按照PCB测试仪器设计实现板测试仪。

公开(公告)号：US5455850A

公开(公告)日：1995-10-03

申请号：US786265

申请日：1991-11-01

申请人： Malcolm R. Howells ,  Chris Jacobsen

发明人： Malcolm R. Howells ,  Chris Jacobsen

IPC分类号： G03F7/20 ,  G03H5/00 ,  G21K1/06 ,  G21K5/00

CPC分类号： G03F7/70408 ,  G03H5/00 ,  G21K1/06 ,  G03H2001/0094

摘要： A non-contact X-ray projection lithography method for producing a desired X-ray image on a selected surface of an X-ray-sensitive material, such as photoresist material on a wafer, the desired X-ray image having image minimum linewidths as small as 0.063 .mu.m, or even smaller. A hologram and its position are determined that will produce the desired image on the selected surface when the hologram is irradiated with X-rays from a suitably monochromatic X-ray source of a selected wavelength .lambda.. On-axis X-ray transmission through, or off-axis X-ray reflection from, a hologram may be used here, with very different requirements for monochromaticity, flux and brightness of the X-ray source. For reasonable penetration of photoresist materials by X-rays produced by the X-ray source, the wavelength X, is preferably chosen to be no more than 13.5 nm in one embodiment and more preferably is chosen in the range 1-5 nm in the other embodiment. A lower limit on linewidth is set by the linewidth of available microstructure writing devices, such as an electron beam.

摘要翻译： 一种非接触式X射线投影光刻方法，用于在诸如晶片上的光致抗蚀剂材料的X射线敏感材料的选定表面上产生期望的X射线图像，所希望的具有图像最小线宽的X射线图像为 小至0.063亩，甚至更小。 确定全息图及其位置，当全息图被来自所选波长λ的适当单色X射线源的X射线照射时，将在所选择的表面上产生期望的图像。 这里可以使用通过全息图进行的轴上X射线透射或离轴X射线反射，对于X射线源的单色度，通量和亮度有非常不同的要求。 为了通过由X射线源产生的X射线合理地穿透光致抗蚀剂材料，在一个实施例中，波长X优选地被选择为不超过13.5nm，更优选地在另一个实施例中选择在1-5nm的范围内 实施例。 线宽的下限由可用的微结构写入装置（例如电子束）的线宽设定。

公开(公告)号：US20060202675A1

公开(公告)日：2006-09-14

申请号：US11079702

申请日：2005-03-14

申请人： Kenneth Parker ,  Chris Jacobsen

发明人： Kenneth Parker ,  Chris Jacobsen

IPC分类号： G01R31/28

CPC分类号： G01R1/06722 ,  G01R31/2805

摘要： A twisting fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit board during in-circuit testing.

摘要翻译： 用于在电路测试期间从焊珠探针的表面清洁氧化物，残留物或其他污染物并在印刷电路板上探测焊珠探针的扭转夹具探头。

公开(公告)号：US20060097737A1

公开(公告)日：2006-05-11

申请号：US10972829

申请日：2004-10-25

申请人： Kenneth Parker ,  Chris Jacobsen

发明人： Kenneth Parker ,  Chris Jacobsen

IPC分类号： G01R31/02

CPC分类号： G01R31/2818 ,  H05K1/0268 ,  H05K3/3452 ,  H05K3/3457 ,  H05K2203/0278 ,  H05K2203/043

摘要： A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to a trace at a test access point and above an exposed surface of the printed circuit board to be accessible for probing by a fixture probe. The test access point structure may be designed and manufactured to permit deformation of the test access point structure upon initial probing of the test access point structure with a fixture probe to ensure electrical contact between the fixture probe and the test access point structure.

公开(公告)号：US20050242824A1

公开(公告)日：2005-11-03

申请号：US10836862

申请日：2004-04-28

申请人： Kenneth Parker ,  Chris Jacobsen ,  Myron Schneider

发明人： Kenneth Parker ,  Chris Jacobsen ,  Myron Schneider

IPC分类号： G01R27/26 ,  G01R31/02 ,  G01R31/04 ,  G01R31/312

CPC分类号： G01R31/312 ,  G01R31/026 ,  G01R31/046

摘要： A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a non-contact connector test probe for a testing a connector of the circuit assembly. A method for testing continuity of electrical paths through a circuit assembly is presented. In the method, one or more nodes of the circuit assembly are stimulated, connector pins of a connector on the circuit assembly are capacitively coupled to a non-contact connector test probe, and an electrical characteristic is measured by a tester coupled to the non-contact connector test probe to determine continuity of electrical paths through the circuit assembly.

摘要翻译： 提出了一种能够通过电路组件测试电气路径的装置。 该装置可以包括用于测试电路组件的连接器的非接触式连接器测试探头。 提出了一种用于测试通过电路组件的电气路径的连续性的方法。 在该方法中，电路组件的一个或多个节点被激励，电路组件上的连接器的连接器引脚电容耦合到非接触式连接器测试探针，并且电特性由耦合到非接触式连接器的测试仪测量， 接触连接器测试探头，以确定通过电路组件的电气路径的连续性。

公开(公告)号：US20100005123A1

公开(公告)日：2010-01-07

申请号：US12166319

申请日：2008-07-01

申请人： Dayton Norrgard ,  Chris Jacobsen

发明人： Dayton Norrgard ,  Chris Jacobsen

IPC分类号： G06F17/30

CPC分类号： G06F21/64 ,  G06F2221/2101 ,  G06F2221/2151

摘要： A process methodology and application for change control monitoring and identification used with a circuit board testing platform. This methodology uses “baselines” to track an approved collection of changes for testing a circuit board. An approver is an authorized user or a user that have permission to modify board-test parameters. Modifications of board-test parameters made by unauthorized persons are reported though a change notification system that can alert quality control systems so corrective action of the change can be taken. The change notification system associates the identity of the circuit board to the changes being made. The system uses digital signature encryption to protect the integrity and verifiability of the data from the test system and prevents data forgery.

摘要翻译： 用于电路板测试平台的变更控制监控和识别的过程方法和应用。 该方法使用“基线”来跟踪用于测试电路板的批准的更改集合。 批准者是授权用户或有权修改板级测试参数的用户。 通过修改通知系统报告未经授权的人员进行的板测试参数的修改，可以提醒质量控制系统，从而可以采取更改的纠正措施。 改变通知系统将电路板的标识与正在进行的改变相关联。 该系统使用数字签名加密来保护来自测试系统的数据的完整性和可验证性，并防止数据伪造。

公开(公告)号：US20070018672A1

公开(公告)日：2007-01-25

申请号：US11188080

申请日：2005-07-23

申请人： Chris Jacobsen ,  Kenneth Parker ,  Myron Schneider ,  Tak Kwan

发明人： Chris Jacobsen ,  Kenneth Parker ,  Myron Schneider ,  Tak Kwan

IPC分类号： G01R31/26

CPC分类号： G01R31/2853 ,  G01R1/0433 ,  G01R31/312

摘要： A method and apparatus is presented for gaining socket testability through the use of a capacitive interposer engineered to create capacitive coupling between signal nodes of a circuit assembly that the tester has access to and nodes of the socket that would not otherwise have any coupling to a testable signal node of the socket. Generally, coupling capacitance is engineered into the interposer by trace and via routing between the signal node of the socket and a location in close proximity to the inaccessible socket node such that their proximity to each other couples them together.