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公开(公告)号:US6032994A
公开(公告)日:2000-03-07
申请号:US200299
申请日:1998-11-25
申请人: Cindy Chen , Liza Chen , Jiuan Lai , Jessie Chang , Kelly Liao
发明人: Cindy Chen , Liza Chen , Jiuan Lai , Jessie Chang , Kelly Liao
CPC分类号: G01R1/06705 , Y10S294/902
摘要: In a semiconductor test equipment, in which test probes are placed into contact with bonding pads of semiconductor chips on a semiconductor wafer, an adjustment tool for adjusting the position of the test probes is disclosed. The adjustment tool comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. The tool is preferably formed of used test probes comprised of tungsten. The tool is plated with a titanium nitride layer to increase the life of the tool.
摘要翻译: 在半导体测试设备中,测试探针被放置成与半导体晶片上的半导体芯片的焊盘接触,公开了一种用于调整测试探针的位置的调节工具。 调整工具包括圆柱形基部,三角形中间部分和平坦的矩形尖端部分。 该工具优选由使用由钨构成的测试探针形成。 该工具镀有氮化钛层以增加工具的使用寿命。
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2.
公开(公告)号:US06541992B2
公开(公告)日:2003-04-01
申请号:US09944722
申请日:2001-09-04
申请人: Richard Wei , Liza Chen
发明人: Richard Wei , Liza Chen
IPC分类号: G01R3102
CPC分类号: G01R31/026
摘要: An apparatus for continuity testing of a pogo pin in a probe comprises a substrate having a pad, a power supply providing a voltage difference between the pad and the pogo pin, and a sensing device signaling when the substrate contacts the probe, and a current is generated by the connection of the pogo pin and the pad.
摘要翻译: 用于探针中的弹簧针的连续性测试的装置包括具有垫的衬底,提供垫和弹簧针之间的电压差的电源以及当衬底接触探针时发出信号的感测装置,并且电流为 通过弹簧销和垫的连接产生。
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