Tools for positioning semiconductor chip test probes
    1.
    发明授权
    Tools for positioning semiconductor chip test probes 有权
    半导体芯片测试探针定位工具

    公开(公告)号:US6032994A

    公开(公告)日:2000-03-07

    申请号:US200299

    申请日:1998-11-25

    IPC分类号: G01R1/067 B25J7/00 G01R31/02

    CPC分类号: G01R1/06705 Y10S294/902

    摘要: In a semiconductor test equipment, in which test probes are placed into contact with bonding pads of semiconductor chips on a semiconductor wafer, an adjustment tool for adjusting the position of the test probes is disclosed. The adjustment tool comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. The tool is preferably formed of used test probes comprised of tungsten. The tool is plated with a titanium nitride layer to increase the life of the tool.

    摘要翻译: 在半导体测试设备中,测试探针被放置成与半导体晶片上的半导体芯片的焊盘接触,公开了一种用于调整测试探针的位置的调节工具。 调整工具包括圆柱形基部,三角形中间部分和平坦的矩形尖端部分。 该工具优选由使用由钨构成的测试探针形成。 该工具镀有氮化钛层以增加工具的使用寿命。

    Apparatus and method for continuity testing of pogo pins in a probe
    2.
    发明授权
    Apparatus and method for continuity testing of pogo pins in a probe 失效
    探针中弹簧针连续性测试的装置和方法

    公开(公告)号:US06541992B2

    公开(公告)日:2003-04-01

    申请号:US09944722

    申请日:2001-09-04

    申请人: Richard Wei Liza Chen

    发明人: Richard Wei Liza Chen

    IPC分类号: G01R3102

    CPC分类号: G01R31/026

    摘要: An apparatus for continuity testing of a pogo pin in a probe comprises a substrate having a pad, a power supply providing a voltage difference between the pad and the pogo pin, and a sensing device signaling when the substrate contacts the probe, and a current is generated by the connection of the pogo pin and the pad.

    摘要翻译: 用于探针中的弹簧针的连续性测试的装置包括具有垫的衬底,提供垫和弹簧针之间的电压差的电源以及当衬底接触探针时发出信号的感测装置,并且电流为 通过弹簧销和垫的连接产生。