公开(公告)号：US20210120352A1

公开(公告)日：2021-04-22

申请号：US16500157

申请日：2017-04-12

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Aleksey Khenkin ,  Kevin Stoddart ,  Gordon Cowan ,  Keith Getz

IPC: H04R29/00 ,  H04R19/04 ,  H04R31/00 ,  G01H3/00

Abstract: An acoustic testing apparatus may include connections for multiple devices under test (DUTs) to support simultaneous testing of two or more miniature electroacoustic devices. The acoustic testing apparatus may allow the testing of multiple DUTs with a ratio of less than one reference microphone per DUT. Thus, the speed of testing DUTs may be increased without adding significant cost through additional reference microphones. For example, a single reference microphone may be used to test two or four DUTs coupled together through an acoustic test cavity.

公开(公告)号：US11190890B2

公开(公告)日：2021-11-30

申请号：US16500157

申请日：2017-04-12

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Aleksey Khenkin ,  Kevin Stoddart ,  Gordon Cowan ,  Keith Getz

IPC: H04R29/00 ,  G01H3/00 ,  H04R19/04 ,  H04R31/00

Abstract: An acoustic testing apparatus may include connections for multiple devices under test (DUTs) to support simultaneous testing of two or more miniature electroacoustic devices. The acoustic testing apparatus may allow the testing of multiple DUTs with a ratio of less than one reference microphone per DUT. Thus, the speed of testing DUTs may be increased without adding significant cost through additional reference microphones. For example, a single reference microphone may be used to test two or four DUTs coupled together through an acoustic test cavity.