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公开(公告)号:US12217898B2
公开(公告)日:2025-02-04
申请号:US18383816
申请日:2023-10-25
Inventor: Aleksey Khenkin , David Patten , Jun Yan
Abstract: A method for constructing a solenoid inductor of an IC package with active/passive devices includes positioning an inner winding substantially around a magnetic core, positioning an outer winding substantially around the inner winding, and using a layered process to perform positioning the inner and outer windings. The layered process includes processing a first conducting layer as a bottom layer of the outer winding, above processing a first dielectric layer, above processing a second conducting layer as a bottom layer of the inner winding, above processing a second dielectric layer, above processing a magnetic core layer, above processing a third dielectric layer, above processing a third conducting layer as a top layer of the inner winding, above processing a fourth dielectric layer, above processing a fourth conducting layer as a top layer of the outer winding, above processing a fifth dielectric layer, and the inner and outer windings are electrically connected.
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公开(公告)号:US20250166881A1
公开(公告)日:2025-05-22
申请号:US18916413
申请日:2024-10-15
Inventor: Aleksey Khenkin , David Patten , Jun Yan
Abstract: A solenoid inductor of an IC package with active/passive devices constructed by a method including positioning an inner winding substantially around a magnetic core, positioning an outer winding substantially around the inner winding, and using a layered process to perform positioning the inner and outer windings. The layered process includes processing a first conducting layer as a bottom layer of the outer winding, above processing a first dielectric layer, above processing a second conducting layer as a bottom layer of the inner winding, above processing a second dielectric layer, above processing a magnetic core layer, above processing a third dielectric layer, above processing a third conducting layer as a top layer of the inner winding, above processing a fourth dielectric layer, above processing a fourth conducting layer as a top layer of the outer winding, above processing a fifth dielectric layer, and the inner and outer windings are electrically connected.
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公开(公告)号:US12244253B2
公开(公告)日:2025-03-04
申请号:US16850843
申请日:2020-04-16
Inventor: Aleksey Khenkin , Steve Proffitt , Marco Janko
IPC: H02P25/034 , G08B6/00
Abstract: A method for minimizing undesired movement of a moving mass of an electromagnetic load may include detecting undesired movement of the moving mass based on real-time measurements of one or more parameters associated with the electromagnetic load and, responsive to detecting undesired movement of the moving mass, affecting a signal applied to the moving mass to reduce the undesired movement.
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公开(公告)号:US11190890B2
公开(公告)日:2021-11-30
申请号:US16500157
申请日:2017-04-12
Inventor: Aleksey Khenkin , Kevin Stoddart , Gordon Cowan , Keith Getz
Abstract: An acoustic testing apparatus may include connections for multiple devices under test (DUTs) to support simultaneous testing of two or more miniature electroacoustic devices. The acoustic testing apparatus may allow the testing of multiple DUTs with a ratio of less than one reference microphone per DUT. Thus, the speed of testing DUTs may be increased without adding significant cost through additional reference microphones. For example, a single reference microphone may be used to test two or four DUTs coupled together through an acoustic test cavity.
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公开(公告)号:US10080084B2
公开(公告)日:2018-09-18
申请号:US15198809
申请日:2016-06-30
Inventor: Sunder S. Kidambi , John C. Tucker , Aleksey Khenkin
CPC classification number: H04R3/06 , H04R29/004 , H04R2201/003
Abstract: In accordance with embodiments of the present disclosure, a system may include a digital correcting network for correcting for an intrinsic highpass filter of a microelectromechanical systems (MEMS) microphone such that a combined phase and magnitude response of a cascade of the intrinsic highpass filter and the digital correcting network substantially approximates the response of a target highpass filter.
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公开(公告)号:US12284493B2
公开(公告)日:2025-04-22
申请号:US18073853
申请日:2022-12-02
Inventor: Ning Li , Hamid Sepehr , Ben Leslie , Aleksey Khenkin , Michael Kurek , Marco A. Janko , Vadim Konradi , Peter Foskey , Aaron Treptow
Abstract: A method of controlling a vibrational transducer, the method comprising: tracking a temperature metric of the vibrational transducer; and controlling a drive signal for the vibrational transducer, where the drive signal is limited to a value to protect the vibrational transducer from over excursion, and where said value is a function of the tracked temperature metric.
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公开(公告)号:US20240238842A1
公开(公告)日:2024-07-18
申请号:US18098396
申请日:2023-01-18
Inventor: Marco Janko , Jorge Reynaga , Chin Yong , Eric Lindemann , Emmanuel Marchais , Hamid Sepehr , Vadim Konradi , Michael Kurek , Filippo Rossi , Anil Lal , Aleksey Khenkin
CPC classification number: B06B1/0276 , H04R29/00 , B06B2201/40
Abstract: A method includes applying a high frequency signal to an electromechanical actuator and measuring a first response of the electromechanical actuator to the high frequency signal, estimating electrical parameters of the electromechanical actuator based on the first response, applying a low frequency broadband signal to the electromechanical actuator and measuring a second response of the electromechanical actuator to the low frequency broadband signal, and estimating mechanical parameters of the electromechanical actuator based on the second response and the estimated electrical parameters.
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公开(公告)号:US11942468B2
公开(公告)日:2024-03-26
申请号:US17303251
申请日:2021-05-25
Inventor: Aleksey Khenkin , Justin Richardson , Michael Robinson , David Patten
CPC classification number: H01L27/0207 , H01L21/78 , H01L23/49816 , H01L23/66 , H03F3/187 , H03F3/45475 , H01L2223/6644 , H03F2200/03
Abstract: A packaged semiconductor die may include a package terminal array comprising a plurality of terminals, wherein a spacing between the plurality of terminals of the ball grid array is less than 0.5 mm. First and second high-voltage circuits of the die may output a differential signal to a first and second terminal that may exceed 15 volts, in which the first high-voltage circuit and the second high-voltage circuit are positioned symmetrically around an axis and in which the first terminal and the second terminal are located at an edge of the package terminal array. A low-voltage circuit may be coupled to a third terminal and positioned between the first high-voltage circuit and the second high-voltage circuit, wherein the low-voltage circuit comprises circuitry organized in columns aligned along an axis and having a width defined by a fraction of the terminal spacing pitch.
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公开(公告)号:US20210120352A1
公开(公告)日:2021-04-22
申请号:US16500157
申请日:2017-04-12
Inventor: Aleksey Khenkin , Kevin Stoddart , Gordon Cowan , Keith Getz
Abstract: An acoustic testing apparatus may include connections for multiple devices under test (DUTs) to support simultaneous testing of two or more miniature electroacoustic devices. The acoustic testing apparatus may allow the testing of multiple DUTs with a ratio of less than one reference microphone per DUT. Thus, the speed of testing DUTs may be increased without adding significant cost through additional reference microphones. For example, a single reference microphone may be used to test two or four DUTs coupled together through an acoustic test cavity.
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公开(公告)号:US20240361356A1
公开(公告)日:2024-10-31
申请号:US18140456
申请日:2023-04-27
Inventor: Aleksey Khenkin , Michael J. Murphy
CPC classification number: G01R1/203 , G01R19/0092
Abstract: A thin-film resistor circuit for an integrated circuit provides low resistance by segmenting a thin-film resistor to provide a wider effective thin-film resistor in a smaller die. The die includes a substrate, multiple electronic devices integrated on the substrate and interconnected to form at least a portion of an electronic circuit, a plurality of interconnect lands arranged in a grid that interconnect the devices with external terminals, and a thin-film resistor implemented by two or more thin-film resistor segments that operate in parallel in the circuit. The segments are disposed between different pairs of adjacent columns of the grid interconnect lands, with one of the thin-film resistor segments electrically connected along its width to lands of a first column of the grid of interconnect lands, and another one of the thin-film resistor segments is electrically connected along its width to lands of a second column of the grid interconnect lands.
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