公开(公告)号：US11536767B2

公开(公告)日：2022-12-27

申请号：US17065799

申请日：2020-10-08

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： James Wells ,  Saurabh Singh ,  Huy Binh Le ,  Gavin Wilson ,  Niall McGurnaghan ,  Simon R. Foster ,  Mark McCloy-Stevens

IPC: G01R31/28 ,  G01R31/56

Abstract: The present disclosure relates to self-test circuitry for a system that includes one or more current control subsystems, each current control subsystem having a load terminal for coupling the current control subsystem to a load. The self-test circuitry comprises: a signal path associated with each current control subsystem, each signal path configured to selectively couple a measurement node to the load terminal of the current control subsystem, wherein the measurement node is common to all of the signal paths; voltage detection circuitry; and test voltage source circuitry configured to provide a test voltage to the measurement node. The voltage detection circuitry is operable to output a signal indicative of a fault condition if a voltage detected at the measurement node differs from the test voltage when the measurement node is coupled to the load terminal.