公开(公告)号：US12292309B2

公开(公告)日：2025-05-06

申请号：US17211073

申请日：2021-03-24

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Siddharth Maru ,  Josh Sanz-Robinson ,  Tejasvi Das ,  John L. Melanson

IPC: G01D18/00 ,  G01D5/20

Abstract: A system may include a plurality of sensors configured to sense a physical quantity and a calibration subsystem configured to perform a calibration comprising: comparing a measured characteristic from each of at least two sensors of the plurality of sensors to determine a sensitivity drift of at least one sensor of the plurality of sensors; based on the measured characteristics of the at least two sensors and stored reference characteristics for the at least two sensors, calculating a normalization factor; and applying the normalization factor to the measured characteristic of the at least one sensor to ensure sensitivity of the plurality of sensors relative to each other remains approximately constant.

公开(公告)号：US11520436B2

公开(公告)日：2022-12-06

申请号：US17097384

申请日：2020-11-13

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Josh Sanz-Robinson ,  Siddharth Maru ,  Tejasvi Das

IPC: G06F3/02 ,  G06F3/041 ,  G06F3/01

Abstract: A correction unit for use in a sensor system, the sensor system comprising a force sensor configured to output a sensor signal indicative of a temporary mechanical distortion of a material under an applied force, the correction unit configured, based on the sensor signal, to: estimate an effect of the applied force on how the material will return towards an undistorted form upon a substantial reduction or removal of the applied force; and generate a corrected signal based on the estimation.

公开(公告)号：US11947756B2

公开(公告)日：2024-04-02

申请号：US17968565

申请日：2022-10-18

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Josh Sanz-Robinson ,  Siddharth Maru ,  Tejasvi Das

IPC: G06F3/041 ,  G06F3/02 ,  G06F3/01

CPC classification number: G06F3/0418 ,  G06F3/02 ,  G06F3/0414 ,  G06F3/016

Abstract: A correction unit for use in a sensor system, the sensor system comprising a force sensor configured to output a sensor signal indicative of a temporary mechanical distortion of a material under an applied force, the correction unit configured, based on the sensor signal, to: estimate an effect of the applied force on how the material will return towards an undistorted form upon a substantial reduction or removal of the applied force; and generate a corrected signal based on the estimation.