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公开(公告)号：US08754665B2
公开(公告)日：2014-06-17
申请号：US13444237
申请日：2012-04-11
IPC分类号： G01R31/20
CPC分类号： G01R31/2808 , Y10T29/49121 , Y10T29/49187
摘要： A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is spring-loaded, and a full set of test probes, including both long-stroke and short-stroke probes, can contact the circuit board or UUT (unit under test). In the second position, the upper stripper plate becomes fixed in position, and only the long-stroke probes can contact the circuit board. The fixed positioning of the upper stripper plate prevents the short-stroke probes from contacting the circuit board even when there is unbalanced loading of probe pressure between the top and bottom of the circuit board, thereby preventing transient signals from interfering with testing. In addition, a vacuum is applied in this position during a non-powered test.
摘要翻译： 用于电路测试器的双级固定器包括可在至少第一位置和第二位置之间滑动的滑板。 在第一个位置，上部剥离板是弹簧加载的，并且包括长行程和短行程探头的全套测试探头可以接触电路板或UUT（被测单元）。 在第二位置，上部剥离板变得固定就位，并且只有长行程探针可以接触电路板。 即使在电路板顶部和底部之间存在探头压力不平衡负载，上部剥离板的固定定位也可以防止短行程探头接触电路板，从而防止瞬态信号干扰测试。 此外，在非电源测试期间，在该位置施加真空。
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公开(公告)号：US20130271171A1
公开(公告)日：2013-10-17
申请号：US13444237
申请日：2012-04-11
IPC分类号： G01R31/20
CPC分类号： G01R31/2808 , Y10T29/49121 , Y10T29/49187
摘要： A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is spring-loaded, and a full set of test probes, including both long-stroke and short-stroke probes, can contact the circuit board or UUT (unit under test). In the second position, the upper stripper plate becomes fixed in position, and only the long-stroke probes can contact the circuit board. The fixed positioning of the upper stripper plate prevents the short-stroke probes from contacting the circuit board even when there is unbalanced loading of probe pressure between the top and bottom of the circuit board, thereby preventing transient signals from interfering with testing. In addition, a vacuum is applied in this position during a non-powered test.
摘要翻译： 用于电路测试器的双级固定器包括可在至少第一位置和第二位置之间滑动的滑板。 在第一个位置，上部剥离板是弹簧加载的，并且包括长行程和短行程探头的全套测试探头可以接触电路板或UUT（被测单元）。 在第二位置，上部剥离板变得固定就位，并且只有长行程探针可以接触电路板。 即使在电路板顶部和底部之间存在探头压力不平衡负载，上部剥离板的固定定位也可以防止短行程探头接触电路板，从而防止瞬态信号干扰测试。 此外，在非电源测试期间，在该位置施加真空。
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