公开(公告)号：US20190227002A1

公开(公告)日：2019-07-25

申请号：US16254804

申请日：2019-01-23

Applicant: Corning incorporated

Inventor： Evan James Bittner ,  David John Brockway ,  Christine Cecala ,  Heather Bossard Decker ,  Shandon Dee Hart ,  Eric Louis Null

IPC: G01N21/958 ,  G01N21/88

Abstract: An inspection apparatus including a light source, a sample holding stage, an image capture device, positioned to receive light from the light source after the light has interacted with a sample on the sample holding stage, and a damage metric. The damage metric includes two or more damage levels, and is a function of light in a test image. Further, the damage metric may correlate to visual observation so that an inspection apparatus may mimic how users of devices will perceive damage to the devices. The damage metric may be adjusted to account for different damage types, for example, abrasion and scratch damage.