公开(公告)号：US20230400510A1

公开(公告)日：2023-12-14

申请号：US17970853

申请日：2022-10-21

Applicant: D-WAVE SYSTEMS INC.

Inventor： Jed D. Whittaker ,  Richard Harris ,  Rahul Deshpande

IPC: G01R31/317

CPC classification number: G01R31/31702 ,  G01R31/31709

Abstract: Systems and methods for measuring noise in discrete regions of multi-layer superconducting fabrication stacks are described. Methods for measuring noise in spatial regions of a superconducting fabrication stacks may include the use of resonators, each having a different geometry. As many resonators as spatial regions are fabricated. Data collected from the resonators may be used to calculate fill fractions and spin densities for different spatial regions of the superconducting fabrication stack. The data may be collected via on-chip electron-spin resonance. The superconducting fabrications may be part of a fabrication stack for a superconducting processor, for example a quantum processor, and the spatial region studied may be proximate to qubit wiring layers.