公开(公告)号：US20230057095A1

公开(公告)日：2023-02-23

申请号：US17456559

申请日：2021-11-24

Applicant: DELTA ELECTRONICS, INC.

Inventor： Yu-Jen CHEN ,  Chih-Yen LIU

IPC: H02J3/00 ,  H02J3/02

Abstract: An embedded power supply apparatus is partially buried in an enclosed structure, is configured to provide a first DC voltage to a plurality of electronic devices, and includes a first power conversion circuit, a plurality of switch circuits, a human-machine interface module and a control circuit. The first power conversion circuit is configured to convert an input AC voltage into the first DC voltage and provide the first DC voltage to the switch circuits. The switch circuits each is configured to selectively transmit the first DC voltage to a corresponding electronic device of the electronic devices according to a corresponding first control signal of a plurality of first control signals. The control circuit is configured to receive a second control signal generated by the human-machine interface module, and generate the first control signals to the switch circuits according to the second control signal.

公开(公告)号：US20180252764A1

公开(公告)日：2018-09-06

申请号：US15861441

申请日：2018-01-03

Applicant: Delta Electronics, Inc.

Inventor： Chien-Chung CHANG ,  Hung-Pin YU ,  Yu-Jen CHEN ,  Wen-Jen LO ,  Chih-Yen LIU

IPC: G01R31/28

Abstract: A composite product testing system including a main management system, a test equipment and a burn-in apparatus is disclosed. The test equipment and the burn-in apparatus are both arranged in a burn-in chamber of the testing system. First, multiple tested products are respectively inserted in multiple gauges of the burn-in chamber, and a burn-in procedure is activated for providing an aging environment. The main management system controls one of the gauges to connect with the test equipment for the test equipment to perform testing on the tested product upon the connected gauge. After the testing is completed, the main management system then controls the gauge to disconnect from the test equipment and re-connect with the burn-in apparatus, so as to monitor the tested product upon the gauge during the burn-in procedure.