公开(公告)号：US20250014880A1

公开(公告)日：2025-01-09

申请号：US18711346

申请日：2022-11-21

Applicant: DH Technologies Development Pte. Ltd.

Inventor： Gordana IVOSEV ,  Nic G. BLOOMFIELD

IPC: H01J49/00 ,  H01J49/02

Abstract: Ion intensities measured by an ADC detector subsystem are filtered using equivalent TDC event realizations. In one embodiment, an intensity measurement is received for at least one ion made by an ADC detector subsystem for each of m extractions of an ion beam, producing m intensities for the ion. Equivalent TDC event realizations are received for the ion for each intensity of the m intensities, producing m equivalent TDC event realizations. A filtered intensity for the ion is calculated that is a combination of the m intensities and the m event realizations. In another embodiment, for the ion, an equivalent TDC event realization is accumulated for ion events up to a threshold count of event realizations, N, and the ADC intensities are accumulated for all remaining ion events. A filtered intensity for the ion is calculated that is a combination of the equivalent TDC event realization and the ADC intensities.