ASSIGNING ISSUES TO TECHNICAL SUPPORT GROUPS BASED ON SKILL AND PRODUCT KNOWLEDGE
    3.
    发明申请
    ASSIGNING ISSUES TO TECHNICAL SUPPORT GROUPS BASED ON SKILL AND PRODUCT KNOWLEDGE 有权
    根据技术和产品知识将技术支持组织问题列为问题

    公开(公告)号:US20140253492A1

    公开(公告)日:2014-09-11

    申请号:US13912028

    申请日:2013-06-06

    IPC分类号: G06F3/044

    CPC分类号: G06F3/044 G06F3/0418

    摘要: A processing device scans, during a first operation, a first plurality of electrodes along a first axis in a capacitive sense array to generate a first plurality of signals corresponding to a mutual capacitance at electrode intersections of the capacitive sense array. During a second operation, the processing device scans a second plurality of electrodes along a second axis in the capacitive sense array to generate a second plurality of signals corresponding to the mutual capacitance at the electrode intersections of the capacitive sense array, wherein the second operation occurs during a different period of time than the first operation. The processing device determines a first coordinate of a conductive object proximate to the capacitive sense array based on the first plurality of signals and a second coordinate of the conductive object based on the second plurality of signals.

    摘要翻译: 处理装置在第一操作期间沿着电容性感测阵列中的第一轴扫描第一多个电极,以产生对应于电容性感测阵列的电极交叉处的互电容的第一多个信号。 在第二操作期间,处理装置沿着电容性感测阵列中的第二轴扫描第二多个电极,以产生对应于电容性感测阵列的电极交叉处的互电容的第二多个信号,其中发生第二次操作 在与第一次操作不同的时间段内。 处理装置基于第一多个信号和基于第二多个信号的导电物体的第二坐标来确定靠近电容性感测阵列的导电物体的第一坐标。