公开(公告)号：US20100095775A1

公开(公告)日：2010-04-22

申请号：US12252714

申请日：2008-10-16

申请人： Dennis P. Sarr ,  Hien T. Bui

发明人： Dennis P. Sarr ,  Hien T. Bui

IPC分类号： G01N29/26

CPC分类号： G01N29/265 ,  G01N29/28 ,  G01N2291/101

摘要： A system for performing ultrasonic testing on a composite part includes an ultrasonic transducer, a shoe for holding the transducer, and means for automatically adjusting position of the transducer during ultrasonic testing. The transducer position is adjusted to account for geometry variations in the part.

摘要翻译： 用于在复合部件上执行超声波测试的系统包括超声波换能器，用于保持换能器的鞋，以及用于在超声波测试期间自动调节换能器的位置的装置。 调整换能器位置以解决零件中的几何变化。

公开(公告)号：US08234942B2

公开(公告)日：2012-08-07

申请号：US12642478

申请日：2009-12-18

申请人： Dennis P. Sarr ,  James C. Kennedy ,  Hien T. Bui

发明人： Dennis P. Sarr ,  James C. Kennedy ,  Hien T. Bui

IPC分类号： G01M19/00

CPC分类号： G01N27/82 ,  G01N29/043 ,  G01N29/225 ,  G01N2291/044 ,  G01N2291/048

摘要： A nondestructive inspection apparatus and method for inspecting a structure having an interior opening portion may comprise an inspection apparatus outer probe unit having a plurality of outer probe unit walls each having a surface corresponding to a respective one of the plurality of exterior surfaces of a respective structure wall, the outer probe unit may comprise a first outer probe member and a second outer probe member, magnetically coupled to each other through magnetic attraction between a magnet on the first outer probe unit member and a magnet on the second outer probe unit member; and a magnetic balance positioned to force the second outer probe unit member in a direction of increased magnetic coupling of the second outer probe unit member to the first outer probe unit member through magnetic repulsion between a magnet on the magnetic balance and a magnet on the second outer probe unit member.

摘要翻译： 用于检查具有内部开口部分的结构的非破坏性检查装置和方法可以包括检查装置外探针单元，其具有多个外探针单元壁，每个外探针单元壁具有对应于相应结构的多个外表面中的相应一个的表面 外探针单元可以包括第一外探针构件和第二外探针构件，其通过第一外探针单元构件上的磁体和第二外探针单元构件上的磁体之间的磁吸引而彼此磁耦合; 以及磁平衡，其被定位成通过磁平衡上的磁体和第二外探针单元构件上的磁体之间的磁排斥力使第二外探针单元构件沿第二外探针单元构件与第一外探针单元构件的磁耦合增大的方向 外探头单元构件。

公开(公告)号：US08082793B2

公开(公告)日：2011-12-27

申请号：US12252714

申请日：2008-10-16

申请人： Dennis P. Sarr ,  Hien T. Bui

发明人： Dennis P. Sarr ,  Hien T. Bui

IPC分类号： G01N29/26

CPC分类号： G01N29/265 ,  G01N29/28 ,  G01N2291/101

摘要： A system for performing ultrasonic testing on a composite part includes an ultrasonic transducer, a shoe for holding the transducer, and means for automatically adjusting position of the transducer during ultrasonic testing. The transducer position is adjusted to account for geometry variations in the part.

摘要翻译： 用于在复合部件上执行超声波测试的系统包括超声波换能器，用于保持换能器的鞋，以及用于在超声波测试期间自动调节换能器的位置的装置。 调整换能器位置以解决零件中的几何变化。

公开(公告)号：US07444876B2

公开(公告)日：2008-11-04

申请号：US11213652

申请日：2005-08-26

申请人： Dennis P. Sarr ,  Hien T. Bui

发明人： Dennis P. Sarr ,  Hien T. Bui

IPC分类号： G01N29/04

CPC分类号： G01N29/226 ,  B33Y80/00 ,  G01N29/265 ,  G01N2291/044 ,  G01N2291/048

摘要： Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder constructed from rapid prototyping, such as stereolithography, and which is configured to support one or more linear inspection sensors. Rapid prototype integrated linear ultrasonic transducer inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices.

摘要翻译： 提供了用于检查结构的装置，系统和方法，其使用由快速成型（例如立体光刻）构成的传感器支架，并且被配置为支撑一个或多个线性检测传感器。 快速原型集成线性超声波传感器检测装置，系统和方法提供快速高效的构造定制检测装置的方法。

公开(公告)号：US09395339B2

公开(公告)日：2016-07-19

申请号：US13975599

申请日：2013-08-26

申请人： Dennis P. Sarr ,  Hien T. Bui

发明人： Dennis P. Sarr ,  Hien T. Bui

IPC分类号： G01N29/265 ,  G01N29/06 ,  G01N29/24 ,  G01N29/22

CPC分类号： G01N29/24 ,  G01N29/225 ,  G01N29/265 ,  G01N2291/0231 ,  G01N2291/2694

摘要： A multi-sensor NDI probe having means for self-alignment of the NDI sensors in conjunction with the movement of the sensor suite along the length of a hollow elongated stiffener having a rounded cap. The apparatus comprises a large-radius curved ultrasonic transducer array with cylindrical focus, which provides complete coverage for the rounded cap, two small-radius convex curved transducer arrays for NDI of the lower outside radii, and two linear transducer arrays for NDI of the sides of the stiffener. The five transducer arrays are supported by respective compliant assemblies which facilitate proper adjustment of the location (i.e., position and orientation) of the transducer arrays during scanning. The positions of the transducer arrays are adjusted to account for geometric variations in the stiffener.

摘要翻译： 多传感器NDI探头具有用于NDI传感器的自对准的装置，与传感器套件沿着具有圆形帽的中空细长加强件的长度的运动相结合。 该装置包括具有圆柱形焦点的大半径弯曲的超声换能器阵列，其提供圆形盖的完整覆盖，用于下外半径的NDI的两个小半径凸弯曲换能器阵列和用于NDI侧的两个线性换能器阵列 的加强筋。 五个换能器阵列由相应的柔性组件支撑，这有助于在扫描期间正确地调整换能器阵列的位置（即位置和取向）。 换能器阵列的位置被调整以考虑加强件的几何变化。

公开(公告)号：US20150053015A1

公开(公告)日：2015-02-26

申请号：US13975599

申请日：2013-08-26

申请人： Dennis P. Sarr ,  Hien T. Bui

发明人： Dennis P. Sarr ,  Hien T. Bui

IPC分类号： G01N29/24

CPC分类号： G01N29/24 ,  G01N29/225 ,  G01N29/265 ,  G01N2291/0231 ,  G01N2291/2694

摘要： A multi-sensor NDI probe having means for self-alignment of the NDI sensors in conjunction with the movement of the sensor suite along the length of a hollow elongated stiffener having a rounded cap. The apparatus comprises a large-radius curved ultrasonic transducer array with cylindrical focus, which provides complete coverage for the rounded cap, two small-radius convex curved transducer arrays for NDI of the lower outside radii, and two linear transducer arrays for NDI of the sides of the stiffener. The five transducer arrays are supported by respective compliant assemblies which facilitate proper adjustment of the location (i.e., position and orientation) of the transducer arrays during scanning. The positions of the transducer arrays are adjusted to account for geometric variations in the stiffener.

摘要翻译： 多传感器NDI探头具有用于NDI传感器的自对准的装置，与传感器套件沿着具有圆形帽的中空细长加强件的长度的运动相结合。 该装置包括具有圆柱形焦点的大半径弯曲的超声换能器阵列，其提供圆形盖的完整覆盖，用于下外半径的NDI的两个小半径凸弯曲换能器阵列和用于NDI侧的两个线性换能器阵列 的加强筋。 五个换能器阵列由相应的柔性组件支撑，这有助于在扫描期间正确地调整换能器阵列的位置（即位置和取向）。 换能器阵列的位置被调整以考虑加强件的几何变化。

公开(公告)号：US07617732B2

公开(公告)日：2009-11-17

申请号：US11368557

申请日：2006-03-06

申请人： Hien T. Bui ,  Dennis P. Sarr

发明人： Hien T. Bui ,  Dennis P. Sarr

IPC分类号： G01N29/04

CPC分类号： G01N29/225 ,  B33Y80/00 ,  G01N29/043 ,  G01N29/221 ,  G01N29/265 ,  G01N29/28 ,  G01N2291/0422

摘要： Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder, which is configured to support one or more curved linear inspection sensors and may be constructed from rapid prototyping, such as stereolithography. Integrated curved linear ultrasonic transducer inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices and inspecting otherwise difficult-to-inspect curved radius features of structures, such as a corner of a hat stringer.

摘要翻译： 提供了用于检查结构的装置，系统和方法，其使用传感器保持器，该传感器保持器构造成支撑一个或多个弯曲线性检测传感器，并且可以由诸如立体光刻的快速原型构造。 集成的弯曲线性超声波换能器检查装置，系统和方法提供快速和有效的构造定制检查装置的方法，并且检查其他难以检测的结构的弯曲半径特征，例如帽子斜角的角部。

公开(公告)号：US20110146424A1

公开(公告)日：2011-06-23

申请号：US12642478

申请日：2009-12-18

申请人： Dennis P. Sarr ,  James C. Kennedy ,  Hien T. Bui

发明人： Dennis P. Sarr ,  James C. Kennedy ,  Hien T. Bui

IPC分类号： G01D21/00

CPC分类号： G01N27/82 ,  G01N29/043 ,  G01N29/225 ,  G01N2291/044 ,  G01N2291/048

摘要： A nondestructive inspection apparatus and method for inspecting a structure having an interior opening portion may comprise an inspection apparatus outer probe unit having a plurality of outer probe unit walls each having a surface corresponding to a respective one of the plurality of exterior surfaces of a respective structure wall, the outer probe unit may comprise a first outer probe member and a second outer probe member, magnetically coupled to each other through magnetic attraction between a magnet on the first outer probe unit member and a magnet on the second outer probe unit member; and a magnetic balance positioned to force the second outer probe unit member in a direction of increased magnetic coupling of the second outer probe unit member to the first outer probe unit member through magnetic repulsion between a magnet on the magnetic balance and a magnet on the second outer probe unit member.

摘要翻译： 用于检查具有内部开口部分的结构的非破坏性检查装置和方法可以包括检查装置外探针单元，其具有多个外探针单元壁，每个外探针单元壁具有对应于相应结构的多个外表面中的相应一个的表面 外探针单元可以包括第一外探针构件和第二外探针构件，其通过第一外探针单元构件上的磁体和第二外探针单元构件上的磁体之间的磁吸引而彼此磁耦合; 以及磁平衡，其被定位成通过磁平衡上的磁体和第二外探针单元构件上的磁体之间的磁排斥力使第二外探针单元构件沿第二外探针单元构件与第一外探针单元构件的磁耦合增大的方向 外探头单元构件。

公开(公告)号：US20080307887A1

公开(公告)日：2008-12-18

申请号：US12196666

申请日：2008-08-22

申请人： Dennis P. Sarr

发明人： Dennis P. Sarr

IPC分类号： G01N29/00

CPC分类号： G01N29/225 ,  B33Y40/00 ,  B33Y80/00 ,  G01N2291/044 ,  G01N2291/106 ,  G01N2291/2638

摘要： Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder constructed from rapid prototyping, such as stereolithography, and which is configured to support a plurality of inspection sensors typically arranged in an ordered matrix array and possibly with one or more additional inspection sensors aligned for inspection of difficult to inspect features of a structure such as radius corner or edge features. Rapid prototype integrated matrix array inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices.

摘要翻译： 提供了用于检查结构的装置，系统和方法，其使用由快速原型制造的传感器支架（例如立体光刻）构造，并且其被配置为支撑通常以有序矩阵阵列布置并且可能具有一个或多个 对齐用于检查难以检测诸如半径角或边缘特征的结构的特征的附加检查传感器。 快速原型集成矩阵阵列检测装置，系统和方法提供快速高效的构造定制检测装置的方法。

公开(公告)号：US5283642A

公开(公告)日：1994-02-01

申请号：US852027

申请日：1992-03-16

申请人： Dennis P. Sarr

发明人： Dennis P. Sarr

IPC分类号： H04N7/18

CPC分类号： H04N7/18

摘要： A scratch measurement system employs a class I or class II laser and digital signal processing in conjunction with a vision system to measure scratch depth. Video data acquired by a vision system is processed to determine threshold values wherein the scratch surface is detected and scratch depth computed. Hard copy graphic results as well as numerical scratch depth measurements are provided on a printer. The unit may be calibrated to a certifiable standard and is provided in a low-cost portable package, suitable for use in manufacturing and repair situations as well as in the laboratory.

摘要翻译： 刮擦测量系统采用I类或II类激光和数字信号处理结合视觉系统来测量划痕深度。 处理由视觉系统获取的视频数据以确定其中检测到划痕表面并计算划痕深度的阈值。 在打印机上提供硬拷贝图形结果以及数字划痕深度测量。 该单元可以被校准为可认证的标准，并且以低成本的便携式包装提供，适用于制造和修理情况以及在实验室中。