公开(公告)号：US20030038933A1

公开(公告)日：2003-02-27

申请号：US10126187

申请日：2002-04-19

Applicant: Dimensional Photonics Inc.

Inventor： Lyle G. Shirley ,  Gary J. Swanson ,  Nathan D. Derr

IPC: G01J001/10

CPC classification number: G01B11/25 ,  G01B11/2504 ,  G01B21/042 ,  G01N21/278

Abstract: An aspect of the invention relates to a calibration standard for a three-dimensional measurement system and various calibration methods and techniques. The calibration standard typically includes a calibration standard surface and a plurality of optical targets. The optical targets being are affixed to the calibration standard surface and define a three-dimensional distribution of optical reference points. The optical targets can be serve as active, passive calibration targets, or combinations of both. In one embodiment, the optical targets include an optical source and a diffusing target, and each of the optical sources are configured to illuminate the respective diffusing target. The optical targets can be removably affixed to the calibration standard surface.

Abstract translation: 本发明的一个方面涉及三维测量系统的校准标准和各种校准方法和技术。 校准标准通常包括校准标准表面和多个光学靶。 光学靶被固定在校准标准表面上并且限定光学参考点的三维分布。 光学目标可以用作主动，被动校准目标或两者的组合。 在一个实施例中，光学目标包括光源和扩散目标，并且每个光源被配置为照射相应的扩散目标。 光学靶可以可拆卸地固定在校准标准表面上。