PROTECTION MODULE FOR EUV LITHOGRAPHY APPARATUS, AND EUV LITHOGRAPHY APPARATUS
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    发明申请
    PROTECTION MODULE FOR EUV LITHOGRAPHY APPARATUS, AND EUV LITHOGRAPHY APPARATUS 有权
    EUV光刻设备的保护模块和EUV光刻设备

    公开(公告)号:US20110216298A1

    公开(公告)日:2011-09-08

    申请号:US13041989

    申请日:2011-03-07

    IPC分类号: G03B27/54

    摘要: In EUV lithography apparatuses (10), it is proposed, in order to lengthen the lifetime of contamination-sensitive components, to arrange them in a protection module. The protection module comprises a housing (23-29) having at least one opening (37-47), in which at least one component (13a, 13b, 15, 16, 18, 19) is arranged and at which one or more gas feeds (30-36) are provided in order to introduce a gas flow into the housing (23-29), which emerges through the at least one opening (37-47). In order to effectively prevent contaminating substances from penetrating into the protection module, a light source (48-56) is arranged at the at least one opening (37-47), which light source illuminates the opening (37-47) with one or more wavelengths by which the contaminating substances can be dissociated before they penetrate through the opening (37-47).

    摘要翻译: 在EUV光刻设备(10)中,为了延长污染敏感元件的寿命,提出将它们安置在保护模块中。 保护模块包括具有至少一个开口(37-47)的壳体(23-29),其中布置有至少一个部件(13a,13b,15,16,18,19),并且一个或多个气体 提供进料(30-36)以便将气流引入通过至少一个开口(37-47)出现的壳体(23-29)中。 为了有效地防止污染物质渗透到保护模块中,光源(48-56)布置在至少一个开口(37-47)处,该光源照射开口(37-47),其中一个或 污染物质在穿透开口(37-47)之前可以分解的更多波长。