Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film
    1.
    发明申请
    Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,处理和/或显示眼泪膜的眼表干涉仪(OSI)装置和系统

    公开(公告)号:US20100253907A1

    公开(公告)日:2010-10-07

    申请号:US12798275

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es)
    2.
    发明申请
    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es) 有权
    用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)方法

    公开(公告)号:US20100259723A1

    公开(公告)日:2010-10-14

    申请号:US12798326

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness (ES)
    3.
    发明申请
    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness (ES) 有权
    用于成像和测量眼泪膜层厚度(ES)的眼表干涉仪(OSI)装置和系统

    公开(公告)号:US20100259721A1

    公开(公告)日:2010-10-14

    申请号:US12798324

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness(es)
    4.
    发明授权
    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness(es) 有权
    用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)装置和系统

    公开(公告)号:US08215774B2

    公开(公告)日:2012-07-10

    申请号:US12798324

    申请日:2010-04-01

    IPC分类号: A61B3/14 A61B3/10

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es)
    5.
    发明授权
    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es) 有权
    用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)方法

    公开(公告)号:US08092023B2

    公开(公告)日:2012-01-10

    申请号:US12798326

    申请日:2010-04-01

    IPC分类号: A61B3/14 A61B3/10

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a TFLT.

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得到的图像进行处理和分析,以测量TFLT。

    Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film
    6.
    发明授权
    Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,加工和/或显示眼泪膜的眼表干涉仪(OSI)装置和系统

    公开(公告)号:US08746883B2

    公开(公告)日:2014-06-10

    申请号:US12798275

    申请日:2010-04-01

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film
    7.
    发明授权
    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,处理和/或显示眼泪膜的眼表干涉测量(OSI)方法

    公开(公告)号:US08545017B2

    公开(公告)日:2013-10-01

    申请号:US12798325

    申请日:2010-04-01

    IPC分类号: A61B3/14 A61B3/10

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film
    8.
    发明申请
    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,处理和/或显示眼泪膜的眼表干涉法(OSI)方法

    公开(公告)号:US20100259722A1

    公开(公告)日:2010-10-14

    申请号:US12798325

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。