Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film
    1.
    发明申请
    Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,处理和/或显示眼泪膜的眼表干涉仪(OSI)装置和系统

    公开(公告)号:US20100253907A1

    公开(公告)日:2010-10-07

    申请号:US12798275

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es)
    2.
    发明申请
    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es) 有权
    用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)方法

    公开(公告)号:US20100259723A1

    公开(公告)日:2010-10-14

    申请号:US12798326

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness (ES)
    3.
    发明申请
    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness (ES) 有权
    用于成像和测量眼泪膜层厚度(ES)的眼表干涉仪(OSI)装置和系统

    公开(公告)号:US20100259721A1

    公开(公告)日:2010-10-14

    申请号:US12798324

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness(es)
    4.
    发明授权
    Ocular surface interferometry (OSI) devices and systems for imaging and measuring ocular tear film layer thickness(es) 有权
    用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)装置和系统

    公开(公告)号:US08215774B2

    公开(公告)日:2012-07-10

    申请号:US12798324

    申请日:2010-04-01

    IPC分类号: A61B3/14 A61B3/10

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es)
    5.
    发明授权
    Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es) 有权
    用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)方法

    公开(公告)号:US08092023B2

    公开(公告)日:2012-01-10

    申请号:US12798326

    申请日:2010-04-01

    IPC分类号: A61B3/14 A61B3/10

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a TFLT.

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得到的图像进行处理和分析,以测量TFLT。

    Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film
    6.
    发明授权
    Ocular surface interferometery (OSI) devices and systems for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,加工和/或显示眼泪膜的眼表干涉仪(OSI)装置和系统

    公开(公告)号:US08746883B2

    公开(公告)日:2014-06-10

    申请号:US12798275

    申请日:2010-04-01

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film
    7.
    发明授权
    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,处理和/或显示眼泪膜的眼表干涉测量(OSI)方法

    公开(公告)号:US08545017B2

    公开(公告)日:2013-10-01

    申请号:US12798325

    申请日:2010-04-01

    IPC分类号: A61B3/14 A61B3/10

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film
    8.
    发明申请
    Ocular surface interferometry (OSI) methods for imaging, processing, and/or displaying an ocular tear film 有权
    用于成像,处理和/或显示眼泪膜的眼表干涉法(OSI)方法

    公开(公告)号:US20100259722A1

    公开(公告)日:2010-10-14

    申请号:US12798325

    申请日:2010-04-01

    IPC分类号: A61B3/14

    摘要: Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).

    摘要翻译: 公开了用于测量眼泪膜的泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)的眼表干涉测量(OSI)装置,系统和方法。 测量的TFLT可用于诊断干眼综合征(DES)。 在某些公开的实施例中,可以控制多波长光源以照射眼泪膜。 从多波长光源发射的光在泪膜中经历光波干涉相互作用。 成像装置可以集中在泪膜的脂质层上,以捕获与第一图像中的背景信号结合的来自泪膜的镜面反射光的光波干涉相互作用。 成像装置还可以聚焦在泪膜的脂质层上,以捕获包含存在于第一图像中的背景信号的第二图像。 可以从第一图像中减去第二图像以减少和/或消除第一图像中的背景信号以产生所得图像。 可以对所得图像进行处理和分析,以测量泪膜层厚度(TFLT),包括脂质层厚度(LLT)和/或水层厚度(ALT)。

    Apparatus and method for providing uniform illumination of a sample plane
    9.
    发明授权
    Apparatus and method for providing uniform illumination of a sample plane 失效
    用于提供样品平面的均匀照明的装置和方法

    公开(公告)号:US5268749A

    公开(公告)日:1993-12-07

    申请号:US736467

    申请日:1991-07-26

    摘要: A conical illuminator for use in colorimetry, spectrophotometry, densitometry or sensitometry. In a preferred embodiment, light from a source such as a pulsed xenon lamp is integrated within a integrating chamber. The light source may be placed in a second integrating chamber adjacent to the aforementioned integrating chamber. Alternatively, the lamp may be placed directly within the integrating chamber. The light is emitted through an exit port and conformed to a conical configuration, according to a pre-selected standard, via an annular stop. An imaging optic relays the conformed light uniformly onto a sample plane. The annular stop is placed at or near the tangential focal length of the imaging optic. The annular stop may be coated with a light absorbing coating, or can be formed with a grooved or mirrored surface. Alternatively, in lieu of an integrating chamber, a diffuser may be employed for homogenizing the light. Various configurations of the imaging optic and annular stop are possible.

    Line protector for a communications circuit
    10.
    发明授权
    Line protector for a communications circuit 失效
    通信电路线路保护器

    公开(公告)号:US4907120A

    公开(公告)日:1990-03-06

    申请号:US282003

    申请日:1988-12-08

    IPC分类号: H01T4/06 H04Q1/14

    CPC分类号: H04Q1/146 H01T4/06 H02H9/06

    摘要: A line protector for a communications circuit. The protector has a three electrode gas tube, the end electrodes of which are connected to the protector's line input terminals. The middle electrode of the tube is connected to the protector's ground terminal. Decoupling devices such as positive temperature coefficient resistors are connected in series between the line input terminals and the protector's equipment terminals. The protector also includes an additional overvoltage arrestor in the form of two diodes connected between the protector's ground terminal and the equipment terminals. The diodes have a lower voltage rating than the gas tube. A conductive clip which is in firm engagement with the protector's ground terminal is used to removably hold the diodes.

    摘要翻译: 通信电路线路保护器。 保护器具有三电极气体管,其末端电极连接到保护器的线路输入端子。 管的中间电极连接到保护器的接地端子。 去耦装置如正温度系数电阻串联在线路输入端子和保护器的设备端子之间。 保护器还包括连接在保护器接地端子和设备端子之间的两个二极管形式的附加过电压避雷器。 二极管的额定电压低于气体管。 与保护器的接地端子牢固接合的导电夹子用于可拆卸地保持二极管。