公开(公告)号：US20140191767A1

公开(公告)日：2014-07-10

申请号：US13736214

申请日：2013-01-08

Applicant: EATON CORPORATION

Inventor： XIN ZHOU ,  MICHAEL DADIAN ,  DALE GASS ,  MARK GOULD ,  EDGAR PEREZ FLORES ,  TIMOTHY THOMPSON

IPC: G01R31/04

CPC classification number: G01R31/04 ,  G01R27/00 ,  G01R31/00 ,  G01R31/08 ,  G01R31/12 ,  G01R31/1209 ,  G01R31/3274 ,  G01R31/3275

Abstract: A method of detecting and locating a micro-interface abnormality within an electrical system having a plurality of conductors and a plurality of electrical connections includes identifying a subset of the plurality of electrical connections by detecting an acoustic signal within the electrical system and analyzing the detected acoustic signal and determining that the detected acoustic signal is indicative of an electrical fault, measuring a contact resistance of each of the subset of the plurality of electrical connections, and identifying at least one of the subset of the plurality of electrical connection points as having a micro-interface abnormality based on the measured contact resistances.

Abstract translation: 在具有多个导体和多个电连接的电气系统内检测和定位微接口异常的方法包括通过检测电气系统内的声学信号来识别多个电连接的子集并分析所检测的声学 信号并确定检测到的声信号指示电故障，测量多个电连接的子集中的每一个的接触电阻，以及将多个电连接点的子集中的至少一个识别为具有微 - 基于测量的接触电阻的接口异常。