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Patent Agency Ranking
1.发明申请公开(公告)号：US20200319593A1
公开(公告)日：2020-10-08
申请号：US16552988
申请日：2019-08-27
Inventor： Jeho NAM
Abstract: The present description may provide a method of generating a hologram measurement pattern for measuring image quality of holographic display, including: generating a test pattern and a common pattern including at least one grayscale bar; generating measurement pattern data by combining the common pattern with a frame of the test pattern; and generating the hologram measurement pattern by inserting a random phase into the measurement pattern data and an apparatus applied thereto, thereby more accurately measuring the quality of the 3D holographic image reproduced by the holographic display.
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公开(公告)号：US20220229953A1
公开(公告)日：2022-07-21
申请号：US17543480
申请日：2021-12-06
Inventor： Jeho NAM , Min-Sik PARK , Seung Hyup SHIN
IPC: G06F30/20
Abstract: A holographic display simulation device and a holographic display simulation method are provided. A holographic display simulation device includes a processor; and a memory including one or more instructions, wherein the one or more instructions are executed by the processor, and a holographic display is simulated by using at least one of a light source part model, a spatial light modulator model, and a display optical system model that respectively model a light source part, a spatial light modulator, and a display optical system of the holographic display.
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公开(公告)号：US20230384735A1
公开(公告)日：2023-11-30
申请号：US18325706
申请日：2023-05-30
Inventor： Jeho NAM
IPC: G03H1/04
CPC classification number: G03H1/0486 , G03H2225/34 , G03H2225/60 , G03H2001/0491
Abstract: There is provided an apparatus and method for generating a hologram through measuring intensity and a phase of a complex light wavefront that is output from a complex modulation spatial light modulator (SLM); determining characteristic information of the complex light wavefront by analyzing the measured intensity and phase of the complex light wavefront; creating distortion correction information for correcting distortion of the complex light wavefront from an artificial neural network by inputting the characteristic information to the artificial neural network; and feeding back the distortion correction information to the complex modulation SLM.
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4.发明申请公开(公告)号：US20200182701A1
公开(公告)日：2020-06-11
申请号：US16552940
申请日：2019-08-27
Inventor： Jeho NAM , Min-Sik PARK , Seung Hyup SHIN
IPC: G01J9/02
Abstract: A method and an apparatus for measuring a coherence of a light source of a holographic display through steps of: photographing an interference pattern generated by light output from the light source; obtaining an interference pattern feature information with respect to the interference pattern from an interference pattern image of the interference pattern; and measuring the coherence of the light source based on the interference pattern feature information, are provided.
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5.发明申请公开(公告)号：US20180341222A1
公开(公告)日：2018-11-29
申请号：US15987704
申请日：2018-05-23
Inventor： Jeho NAM , Jin Woong KIM
Abstract: An apparatus for measuring a spatial resolution of a hologram reconstructed image optically reconstructed on a space is provided. The apparatus for measuring a spatial resolution of a hologram reconstructed image includes: a measuring unit measuring first spatial frequency resolving powers for a horizontal direction of the hologram reconstructed image and second spatial frequency resolving powers for a vertical direction of the hologram reconstructed image at first spatial positions having a predetermined interval in horizontal and vertical directions within a viewing angle range of the hologram reconstructed image; and an evaluating unit evaluating the spatial resolution of the hologram reconstructed image using the first spatial frequency resolving powers and the second spatial frequency resolving powers measured at each of the first spatial positions.
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