公开(公告)号：US09453872B2

公开(公告)日：2016-09-27

申请号：US13944686

申请日：2013-07-17

申请人： ESPEC CORP.

发明人： Michiya Kusaka

IPC分类号： G01R31/26

CPC分类号： G01R31/2619

摘要： Provided is a power cycle test apparatus that eliminates the need to measure a thermal resistance in a power cycle test and that pursues power saving in the evaluation of IGBT reliability by exactly applying a required thermal stress through the automatic adjustment of a stress current. The power cycle test apparatus performs a power cycle test for an IGBT to be tested by applying a thermal stress to the IGBT to be tested through the intermittent application of a stress current thereto. The apparatus applies the stress current to the IGBT to be tested and thereafter applies a current for measurement to the IGBT to be tested to measure a collector-emitter voltage of the IGBT to be tested. The apparatus further obtains a junction temperature of the IGBT to be tested from the measured collector-emitter voltage and a temperature coefficient of the IGBT to be tested.

摘要翻译： 提供了一种功率循环测试装置，其消除了在功率循环测试中测量热阻的需要，并且通过在应力电流的自动调整中精确地施加所需的热应力来追求节能以评估IGBT的可靠性。 动力循环试验装置通过向应力电流的间歇施加对待测试的IGBT施加热应力来对要测试的IGBT进行功率循环试验。 该装置将应力电流施加到要测试的IGBT，然后将待测电流用于测量的IGBT，以测量待测IGBT的集电极 - 发射极电压。 该装置还从所测得的集电极 - 发射极电压和待测IGBT的温度系数中获得待测IGBT的结温。

公开(公告)号：US20140021973A1

公开(公告)日：2014-01-23

申请号：US13944686

申请日：2013-07-17

申请人： ESPEC CORP.

发明人： Michiya Kusaka

IPC分类号： G01R31/26

CPC分类号： G01R31/2619

摘要： Provided is a power cycle test apparatus that eliminates the need to measure a thermal resistance in a power cycle test and that pursues power saving in the evaluation of IGBT reliability by exactly applying a required thermal stress through the automatic adjustment of a stress current. The power cycle test apparatus performs a power cycle test for an IGBT to be tested by applying a thermal stress to the IGBT to be tested through the intermittent application of a stress current thereto. The apparatus applies the stress current to the IGBT to be tested and thereafter applies a current for measurement to the IGBT to be tested to measure a collector-emitter voltage of the IGBT to be tested. The apparatus further obtains a junction temperature of the IGBT to be tested from the measured collector-emitter voltage and a temperature coefficient of the IGBT to be tested.

摘要翻译： 提供了一种功率循环测试装置，其消除了在功率循环测试中测量热阻的需要，并且通过在应力电流的自动调整中精确地施加所需的热应力来追求节能以评估IGBT的可靠性。 动力循环试验装置通过向应力电流的间歇施加对待测试的IGBT施加热应力来对要测试的IGBT进行功率循环试验。 该装置将应力电流施加到要测试的IGBT，然后将待测电流用于测量的IGBT，以测量待测IGBT的集电极 - 发射极电压。 该装置还从所测得的集电极 - 发射极电压和待测IGBT的温度系数中获得待测IGBT的结温。