公开(公告)号：US20150055126A1

公开(公告)日：2015-02-26

申请号：US14384119

申请日：2013-03-08

申请人： ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE)

发明人： Stéphane Gueu ,  Nicolas La Villonniere ,  Fabien Muradore ,  Asma Lakhoua

IPC分类号： G01M11/02

CPC分类号： G01M11/025 ,  G01B11/24 ,  G01M11/0264 ,  G01M11/0271

摘要： The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structure of a component bounded by a first side (10) and a second side (20), said method comprising steps of: (S1) measuring a first signal (MS1) resulting from a first conversion of a first probe signal (PS1), by at least said first side (10); (S2) measuring a second signal (MS2) resulting from a second conversion of a second probe signal (PS2), by at least said second side (20); (S3) determining a third conversion making it possible to convert a first set of coordinates (R1) associated with the measurement of the first signal (MS1) to a second set of coordinates (R2) associated with the measurement of the second signal (MS2); (S10) estimating said first side (10) using the first signal (MS1), said first simulation and a first cost criterion (V1) quantifying a difference between the estimation (FS1) and the first signal (MS1); and (S20) estimating said second side (20) using the second signal (MS2), said second simulation, said third conversion and a second cost criterion (V2) quantifying a difference between the estimation (ES2) and the second signal (MS2).

摘要翻译： 本发明的主题是用于测量光学部件的几何或光学结构的方法和系统。 特别地，本发明涉及一种用于测量由第一侧（10）和第二侧（20）界定的部件的几何结构的方法，所述方法包括以下步骤：（S1）测量产生的第一信号（MS1） 至少所述第一侧（10）从第一探测信号（PS1）的第一转换开始。 （S2）通过至少所述第二侧（20）测量由第二探测信号（PS2）的第二转换产生的第二信号（MS2）; （S3）确定第三转换，使得可以将与第一信号（MS1）的测量相关联的第一组坐标（R1）转换为与第二信号（MS2）的测量相关联的第二坐标系（R2） ）; （S10）使用第一信号（MS1），所述第一模拟和量化估计（FS1）与第一信号（MS1）之间的差的第一成本标准（V1））来估计所述第一侧（10） 以及（S20）使用第二信号（MS2），所述第二模拟，所述第三转换和第二成本标准（V2）估计所述第二侧（20），以及量化估计（ES2）和第二信号（MS2）之间的差的第二成本标准 。

公开(公告)号：US09109976B2

公开(公告)日：2015-08-18

申请号：US14384119

申请日：2013-03-08

申请人： ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE)

发明人： Stéphane Gueu ,  Nicolas La Villonniere ,  Fabien Muradore ,  Asma Lakhoua

IPC分类号： G01M11/02 ,  G01B11/24

CPC分类号： G01M11/025 ,  G01B11/24 ,  G01M11/0264 ,  G01M11/0271

摘要： The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structure of a component bounded by a first side (10) and a second side (20), said method comprising steps of: (S1) measuring a first signal (MS1) resulting from a first conversion of a first probe signal (PS1), by at least said first side (10); (S2) measuring a second signal (MS2) resulting from a second conversion of a second probe signal (PS2), by at least said second side (20); (S3) determining a third conversion making it possible to convert a first set of coordinates (R1) associated with the measurement of the first signal (MS1) to a second set of coordinates (R2) associated with the measurement of the second signal (MS2); (S10) estimating said first side (10) using the first signal (MS1), said first simulation and a first cost criterion (V1) quantifying a difference between the estimation (FS1) and the first signal (MS1); and (S20) estimating said second side (20) using the second signal (MS2), said second simulation, said third conversion and a second cost criterion (V2) quantifying a difference between the estimation (ES2) and the second signal (MS2).

摘要翻译： 本发明的主题是用于测量光学部件的几何或光学结构的方法和系统。 特别地，本发明涉及一种用于测量由第一侧（10）和第二侧（20）界定的部件的几何结构的方法，所述方法包括以下步骤：（S1）测量产生的第一信号（MS1） 至少所述第一侧（10）从第一探测信号（PS1）的第一转换开始。 （S2）通过至少所述第二侧（20）测量由第二探测信号（PS2）的第二转换产生的第二信号（MS2）; （S3）确定第三转换，使得可以将与第一信号（MS1）的测量相关联的第一组坐标（R1）转换为与第二信号（MS2）的测量相关联的第二坐标系（R2） ）; （S10）使用第一信号（MS1），所述第一模拟和量化估计（FS1）与第一信号（MS1）之间的差的第一成本标准（V1））来估计所述第一侧（10） 以及（S20）使用第二信号（MS2），所述第二模拟，所述第三转换和第二成本标准（V2）估计所述第二侧（20），以及量化估计（ES2）和第二信号（MS2）之间的差的第二成本标准 。