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公开(公告)号：US20240159432A1
公开(公告)日：2024-05-16
申请号：US18281217
申请日：2022-03-08
发明人： Ryker EADS , James Roger P . Angel
CPC分类号： F24S40/90 , F24S23/715 , F24S50/20 , G01M11/005 , G01M11/025 , F24S2050/25
摘要： A system for providing a contour map of the surface of a heliostat from reflected sunlight using a fly's eye camera. The system includes an entrance screen configured to receive sunlight reflected by said heliostat; an array of imaging apertures extending across the entrance screen, each aperture forming an image of said heliostat from a different viewpoint to provide a plurality of heliostat images; one or more digital cameras configured to view all of said plurality of heliostat images; an image processor configured to map out from the plurality of heliostat images a location of sunlight delivered to the entrance screen to obtain a plurality of maps, and to provide, based on centroids of said maps a tip and tilt of each said subsection The reflecting surface profile of the heliostat is obtained by integration of the subsection tilts across all the subsections.
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公开(公告)号：US20190242781A1
公开(公告)日：2019-08-08
申请号：US16271706
申请日：2019-02-08
申请人： AMO Groningen B.V.
发明人： Robert Rosen , Mihai State , Marrie van der Mooren , Mengchan Sun , Hendrik A. Weeber , Tjeerd Zuidema
IPC分类号： G01M11/02 , G01N21/47 , G01N21/958
CPC分类号： G01M11/025 , G01M11/0242 , G01N21/4788 , G01N21/958 , G01N2021/9583
摘要： A multi-wavelength wavefront system and method for measuring diffractive lenses. A system may include one or more light sources configured to emit a plurality of wavelengths of light for diffraction by a diffractive lens. A light sensor may be configured to receive the light that is diffracted by the diffractive intraocular lens. A processor may be configured to determine one or more of the plurality of wavelengths that have a peak diffraction efficiency for the diffractive intraocular lens based on the light received by the light sensor.
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公开(公告)号：US20190154427A1
公开(公告)日：2019-05-23
申请号：US16251703
申请日：2019-01-18
申请人： Carl Zeiss SMT GmbH
发明人： Jochen HETZLER
CPC分类号： G01B9/02039 , G01B9/02057 , G01B11/2441 , G01B2290/50 , G01M11/025 , G01M11/0264 , G01M11/0271
摘要： A measurement apparatus (10) for determining a shape of an optical surface. An illumination module (16) produces an illumination wave (34), an interferometer (18) splits the wave into a test wave (50), which is directed onto the optical surface, and a reference wave (52). The relative tilt between the waves produces a multi-fringe interference pattern (66) in a detection plane (62) of the interferometer when the waves are superposed. A pupil plane (28) of the illumination module is arranged in a Fourier plane of the detection plane and the illumination module is configured to produce the illumination wave so that the intensity distribution thereof in the pupil plane includes at least one spatially isolated and contiguous surface region (38) such that a rectangle (74) with the smallest possible area fitted to the surface region or the totality of surface regions has an aspect ratio of at least 1.5:1.
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公开(公告)号：US20180252615A1
公开(公告)日：2018-09-06
申请号：US15952354
申请日：2018-04-13
发明人： John E. Greivenkamp, JR. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
CPC分类号： G01M11/025 , G01B9/02038 , G01B9/0209 , G01M11/0214 , G01M11/0271
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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公开(公告)号：US09958355B2
公开(公告)日：2018-05-01
申请号：US15154454
申请日：2016-05-13
申请人： LUMETRICS, INC.
CPC分类号： G01M11/0271 , G01M11/02 , G01M11/0207 , G01M11/0235 , G01M11/025 , G01M11/0278 , G01M11/0285
摘要： An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
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公开(公告)号：US09797804B2
公开(公告)日：2017-10-24
申请号：US14930489
申请日：2015-11-02
CPC分类号： G01M11/0242 , G01B11/00 , G01B11/24 , G01B21/04 , G01M11/0207 , G01M11/0214 , G01M11/025
摘要： The spatial structure of an optical element is determined. The optical element has a first optically active surface and a second optically active surface. The optical element is arranged in a holding device. The position of a point (P) on the first optically active surface and the position of a point (P′) on the second optically active surface are referenced in a coordinate system fixed to the holding device. The topography of the first optically active surface is determined in a coordinate system referenced to the holding device by the position of point (P) and the spatial structure of the optical element is calculated from the topography of the first optically active surface and from a data set as to the topography of the second optically active surface. The data set is referenced to the fixed coordinate system of the holding device by the position of point (P′).
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公开(公告)号：US09658129B2
公开(公告)日：2017-05-23
申请号：US14825355
申请日：2015-08-13
申请人： Zygo Corporation
CPC分类号： G01M11/0271 , G01B11/2441 , G01M11/025
摘要： A method for determining information about a transparent optical element including a lens portion and a plane parallel portion, the lens portion having at least one curved surface and the plane parallel portion having opposing first and second surfaces, includes: directing measurement light to the transparent optical element; detecting measurement light reflected from at least one location on the first surface of the plane parallel portion; detecting measurement light reflected from the second surface of the plane parallel portion at a location corresponding to the at least one location on the first surface; determining, based on the detected light, information about the plane parallel portion; and evaluating the transparent optical element based on the information about the plane parallel portion.
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公开(公告)号：US09599534B2
公开(公告)日：2017-03-21
申请号：US14825317
申请日：2015-08-13
申请人： Zygo Corporation
CPC分类号： G01M11/0271 , G01B11/2441 , G01M11/025
摘要： A method for determining information about an object including a curved portion and a planar portion, the curved portion having a first curved surface having an apex and defining an axis of the object, includes: directing measurement light to the object; detecting measurement light reflected from the first curved surface of the curved portion; detecting measurement light reflected from at least one other surface of the object; and determining, based on the detected light, information about the apex of the first curved surface of the curved portion.
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9.发明授权Wavefront measurement method, shape measurement method, optical element manufacturing method, optical apparatus manufacturing method, program, and wavefront measurement apparatus 有权波前测量方法，形状测量方法，光学元件制造方法，光学装置制造方法，程序和波前测量装置公开(公告)号：US09574967B2
公开(公告)日：2017-02-21
申请号：US14446150
申请日：2014-07-29
发明人： Atsushi Maeda
CPC分类号： G01M11/0207 , G01J9/00 , G01M11/025 , G01M11/0257 , G01M11/0271
摘要： A wavefront measurement method includes the steps of causing object light to be incident on a Shack-Hartmann sensor, capturing a first spot image under image pickup conditions, calculating data of first spot positions that correspond to the first spot image, calculating second spot positions by simulating a second spot image on the basis of the image pickup condition and information of a travelling direction of diffracted light generated when the object light passes through the microlenses, and reducing detection errors of the spot positions by correcting the data of the first spot positions on the basis of data of the second spot positions including data of a detection error due to the diffracted light.
摘要翻译： 波前测量方法包括以下步骤：使物体光入射到Shack-Hartmann传感器上，在摄像条件下拍摄第一斑点图像，计算与第一斑点图像对应的第一斑点位置的数据， 基于图像拾取条件和当物体光通过微透镜时产生的衍射光的行进方向的信息来模拟第二斑点图像，并且通过校正第一斑点位置的数据来减少斑点位置的检测误差 第二点位置的数据的基础包括由衍射光引起的检测误差的数据。
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10.发明申请公开(公告)号：US20160320263A1
公开(公告)日：2016-11-03
申请号：US15207830
申请日：2016-07-12
申请人： OLYMPUS CORPORATION
发明人： Kanato ADACHI
IPC分类号： G01M11/08
CPC分类号： G01M11/08 , G01M11/0221 , G01M11/025
摘要： According to one aspect, an eccentricity amount obtainment method is a method of obtaining shift eccentricity amounts of lens frames through in a lens barrel that includes the plurality of lens frames having lens cells, the eccentricity amount obtainment method including arranging, in each of the lens cells, a flat plate member on which an index is formed and which has optical transparency and arranging the lens frames in the lens barrel in a prescribed order so as to assemble an assembly, a emitting illumination light to the flat plate members, obtaining pieces of information related to positions of the indexes formed on the flat plate members, and obtaining, as the shift eccentricity amounts of the lens frames, the positional displacement amounts with respect to the indexes formed on the flat plate members with respect to an arbitrary position.
摘要翻译： 根据一个方面，偏心量获得方法是通过在包括具有透镜单元的多个透镜框的透镜镜筒中获得透镜框的偏移偏心量的方法，所述偏心量获取方法包括在每个透镜 单元，其上形成有折射率的平板构件，其具有光学透明性，并且以规定的顺序将透镜框架布置在镜筒中，以组装组件，向平板构件发射照明光，获得片 关于形成在平板部件上的索引的位置的信息，并且获得相对于在平板部件上相对于任意位置形成的索引的位置偏移量作为透镜框的偏移偏心量。
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