Short circuit test device
    3.
    发明授权

    公开(公告)号:US11831152B2

    公开(公告)日:2023-11-28

    申请号:US17340120

    申请日:2021-06-07

    CPC classification number: H02H7/262 G01R31/52

    Abstract: A short circuit test device includes: a first line test conductor couplable to a first load line conductor of an electric load network and a neutral test conductor couplable to a neutral conductor of the electric load network; a voltage source switchable to the first line test conductor and the neutral test conductor to output a predefinable test signal; a measurement unit for measuring an electric voltage and/or current, the measurement unit including measurement inputs which are connectable to the first line test conductor and the neutral test conductor, the measurement unit including an output for providing a measurement signal; and a control unit connected to the voltage source and the measurement unit, the control unit: causing the voltage source to apply a test voltage to the first line test conductor and the neutral test conductor and comparing the measurement signal provided by the measurement unit.

    SHORT CIRCUIT TEST DEVICE
    4.
    发明申请

    公开(公告)号:US20210391712A1

    公开(公告)日:2021-12-16

    申请号:US17340120

    申请日:2021-06-07

    Abstract: A short circuit test device includes: a first line test conductor couplable to a first load line conductor of an electric load network and a neutral test conductor couplable to a neutral conductor of the electric load network; a voltage source switchable to the first line test conductor and the neutral test conductor to output a predefinable test signal; a measurement unit for measuring an electric voltage and/or current, the measurement unit including measurement inputs which are connectable to the first line test conductor and the neutral test conductor, the measurement unit including an output for providing a measurement signal; and a control unit connected to the voltage source and the measurement unit, the control unit: causing the voltage source to apply a test voltage to the first line test conductor and the neutral test conductor and comparing the measurement signal provided by the measurement unit.

Patent Agency Ranking