Methods and systems for measurement and control of process parameters
    1.
    发明授权
    Methods and systems for measurement and control of process parameters 有权
    测量和控制过程参数的方法和系统

    公开(公告)号:US08463423B2

    公开(公告)日:2013-06-11

    申请号:US12803385

    申请日:2010-06-25

    IPC分类号: G06F19/00

    摘要: Systems and methods for monitoring various process parameters, primarily in connection with processes for the sterilization of particulate foods in a continuous thermal process, make use of application specific integrated circuits (ASIC) that provide process-related data for batch or continuous thermal treatment when the circuit is embedded in a particle subjected to such treatment. The preferred methods are described in connection with process design, and with at least near real-time process control using process data provided by such circuits.

    摘要翻译: 用于监测各种工艺参数的系统和方法主要涉及在连续热处理中对颗粒食品灭菌的过程,利用专用集成电路(ASIC),其提供用于批次或连续热处理的过程相关数据 电路嵌入经受这种处理的颗粒中。 优选的方法结合工艺设计进行描述,并使用由这种电路提供的工艺数据进行至少近实时过程控制。

    Methods and systems for measurement and control of process parameters
    2.
    发明申请
    Methods and systems for measurement and control of process parameters 有权
    测量和控制过程参数的方法和系统

    公开(公告)号:US20110320060A1

    公开(公告)日:2011-12-29

    申请号:US12803385

    申请日:2010-06-25

    IPC分类号: G05D23/00 G06F19/00 G01N31/00

    摘要: Systems and methods for monitoring various process parameters, primarily in connection with processes for the sterilization of particulate foods in a continuous thermal process, make use of application specific integrated circuits (ASIC) that provide process-related data for batch or continuous thermal treatment when the circuit is embedded in a particle subjected to such treatment. The preferred methods are described in connection with process design, and with at least near real-time process control using process data provided by such circuits.

    摘要翻译: 用于监测各种工艺参数的系统和方法主要涉及在连续热处理中对颗粒食品灭菌的过程,利用专用集成电路(ASIC),其提供用于批次或连续热处理的过程相关数据 电路嵌入经受这种处理的颗粒中。 优选的方法结合工艺设计进行描述,并使用由这种电路提供的工艺数据进行至少近实时过程控制。