公开(公告)号：US20140115400A1

公开(公告)日：2014-04-24

申请号：US14028486

申请日：2013-09-16

Applicant: Electronics and Telecommunications Research Institute

Inventor： Yong-Hyuk MOON ,  Jeong-Nyeo KIM ,  Bo-Heung CHUNG ,  Jin-Hee HAN ,  Dae-Won KIM ,  Hwa-Shin MOON

IPC: G06F11/07

CPC classification number: G06F11/079 ,  G06F11/0748 ,  G06F11/0793 ,  G06F11/3409 ,  G06F11/3452 ,  H04L41/0631 ,  H04L41/0883

Abstract: There is provided a method of fault management of a smart device including comparing a value of a fault detection indicator (hereinafter referred to as ‘FDI’) in a normal state, which detects faults generated in the smart device, with respect to at least one performance indicator, with an FDI value observed in real time and detecting the faults by calculating a relative variation level of the observed values, and creating a diagnosis object (hereinafter referred to as ‘DO’) including a cause and a countermeasure of the detected fault and analyzing the fault.

Abstract translation: 提供了一种智能设备的故障管理方法，包括将检测智能设备中产生的故障的正常状态下的故障检测指示符（以下称为“FDI”）的值相对于至少一个 性能指标，实时观察FDI值，并通过计算观测值的相对变化水平检测故障，并创建诊断对象（以下称为“DO”），其中包括检测到的故障的原因和对策 并分析故障。